Spectral wavefront optical reconstruction by diffraction

E. Frumker; G. G. Paulus; H. Niikura; D. M. Villeneuve; P. B. Corkum

Spectral wavefront optical reconstruction by diffraction

E. Frumker, G. G. Paulus, H. Niikura, D. M. Villeneuve, P. B. Corkum

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We demonstrate a new concept of spectrally-resolved wavefront characterization, particular useful for high-harmonic and soft X-ray radiation. It is based on an analysis of radiation diffracted from a slit scanned in front of flat-field spectrometer.

Original language	English
Title of host publication	Conference on Lasers and Electro-Optics, CLEO 2010
Publication status	Published - 2010
Externally published	Yes
Event	Conference on Lasers and Electro-Optics, CLEO 2010 - San Jose, CA, United States Duration: 2010 May 16 → 2010 May 21

Publication series

Name	Optics InfoBase Conference Papers
ISSN (Electronic)	2162-2701

Other

Other	Conference on Lasers and Electro-Optics, CLEO 2010
Country/Territory	United States
City	San Jose, CA
Period	10/5/16 → 10/5/21

ASJC Scopus subject areas

Instrumentation
Atomic and Molecular Physics, and Optics

Cite this

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title = "Spectral wavefront optical reconstruction by diffraction",

abstract = "We demonstrate a new concept of spectrally-resolved wavefront characterization, particular useful for high-harmonic and soft X-ray radiation. It is based on an analysis of radiation diffracted from a slit scanned in front of flat-field spectrometer.",

author = "E. Frumker and Paulus, {G. G.} and H. Niikura and Villeneuve, {D. M.} and Corkum, {P. B.}",

year = "2010",

language = "English",

isbn = "9781557528896",

series = "Optics InfoBase Conference Papers",

booktitle = "Conference on Lasers and Electro-Optics, CLEO 2010",

}

TY - GEN

T1 - Spectral wavefront optical reconstruction by diffraction

AU - Frumker, E.

AU - Paulus, G. G.

AU - Niikura, H.

AU - Villeneuve, D. M.

AU - Corkum, P. B.

PY - 2010

Y1 - 2010

N2 - We demonstrate a new concept of spectrally-resolved wavefront characterization, particular useful for high-harmonic and soft X-ray radiation. It is based on an analysis of radiation diffracted from a slit scanned in front of flat-field spectrometer.

AB - We demonstrate a new concept of spectrally-resolved wavefront characterization, particular useful for high-harmonic and soft X-ray radiation. It is based on an analysis of radiation diffracted from a slit scanned in front of flat-field spectrometer.

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UR - http://www.scopus.com/inward/citedby.url?scp=84894106924&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84894106924

SN - 9781557528896

T3 - Optics InfoBase Conference Papers

BT - Conference on Lasers and Electro-Optics, CLEO 2010

T2 - Conference on Lasers and Electro-Optics, CLEO 2010

Y2 - 16 May 2010 through 21 May 2010

ER -

Spectral wavefront optical reconstruction by diffraction

Abstract

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ASJC Scopus subject areas

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