Spectral wavefront optical reconstruction by diffraction

E. Frumker, G. G. Paulus, Hiromichi Niikura, D. M. Villeneuve, P. B. Corkum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate a new concept of spectrally-resolved wavefront characterization, particular useful for high-harmonic and soft X-ray radiation. It is based on an analysis of radiation diffracted from a slit scanned in front of flat-field spectrometer.

Original languageEnglish
Title of host publicationLasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010
Publication statusPublished - 2010
Externally publishedYes
EventLasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010 - San Jose, CA
Duration: 2010 May 162010 May 21

Other

OtherLasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010
CitySan Jose, CA
Period10/5/1610/5/21

Fingerprint

Wavefronts
Diffraction
Radiation
radiation
diffraction
slits
Spectrometers
spectrometers
harmonics
X rays
x rays

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation

Cite this

Frumker, E., Paulus, G. G., Niikura, H., Villeneuve, D. M., & Corkum, P. B. (2010). Spectral wavefront optical reconstruction by diffraction. In Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010 [5500916]

Spectral wavefront optical reconstruction by diffraction. / Frumker, E.; Paulus, G. G.; Niikura, Hiromichi; Villeneuve, D. M.; Corkum, P. B.

Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010. 2010. 5500916.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Frumker, E, Paulus, GG, Niikura, H, Villeneuve, DM & Corkum, PB 2010, Spectral wavefront optical reconstruction by diffraction. in Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010., 5500916, Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010, San Jose, CA, 10/5/16.
Frumker E, Paulus GG, Niikura H, Villeneuve DM, Corkum PB. Spectral wavefront optical reconstruction by diffraction. In Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010. 2010. 5500916
Frumker, E. ; Paulus, G. G. ; Niikura, Hiromichi ; Villeneuve, D. M. ; Corkum, P. B. / Spectral wavefront optical reconstruction by diffraction. Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010. 2010.
@inproceedings{c0291a75b9c04f8087c56cdbf1cf3ebe,
title = "Spectral wavefront optical reconstruction by diffraction",
abstract = "We demonstrate a new concept of spectrally-resolved wavefront characterization, particular useful for high-harmonic and soft X-ray radiation. It is based on an analysis of radiation diffracted from a slit scanned in front of flat-field spectrometer.",
author = "E. Frumker and Paulus, {G. G.} and Hiromichi Niikura and Villeneuve, {D. M.} and Corkum, {P. B.}",
year = "2010",
language = "English",
isbn = "9781557528902",
booktitle = "Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010",

}

TY - GEN

T1 - Spectral wavefront optical reconstruction by diffraction

AU - Frumker, E.

AU - Paulus, G. G.

AU - Niikura, Hiromichi

AU - Villeneuve, D. M.

AU - Corkum, P. B.

PY - 2010

Y1 - 2010

N2 - We demonstrate a new concept of spectrally-resolved wavefront characterization, particular useful for high-harmonic and soft X-ray radiation. It is based on an analysis of radiation diffracted from a slit scanned in front of flat-field spectrometer.

AB - We demonstrate a new concept of spectrally-resolved wavefront characterization, particular useful for high-harmonic and soft X-ray radiation. It is based on an analysis of radiation diffracted from a slit scanned in front of flat-field spectrometer.

UR - http://www.scopus.com/inward/record.url?scp=77957582409&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77957582409&partnerID=8YFLogxK

M3 - Conference contribution

SN - 9781557528902

BT - Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010

ER -