Abstract
Substantial progress has been made with in-situ use of optical reflectance spectroscopy and Raman spectroscopy in studies of the properties of solid-liquid interfaces and particularly metal- and semiconductor-electrolyte interfaces. Such techniques provide molecular level information concerning adsorbed species and various thin films not available from electrochemical and other measurements. Ex-situ techniques including electron and ion spectroscopies also have proved helpful in understanding the properties of solid-liquid interfaces but special techniques are necessary to minimize changes in the surface structure of the solid during the transfer between the liquid and ultrahigh vacuum environment. Some of the results obtained recently by various workers using such transfer techniques in the study of adsorption on single crystals at electrochemical interfaces are reviewed. For adsorption on some solid surfaces there is parallel behavior in the liquid and vacuum environments and comparison affords insight as to the interactions of the adsorbed species at solid-liquid interfaces.
| Original language | English |
|---|---|
| Pages (from-to) | 628-633 |
| Number of pages | 6 |
| Journal | Journal of vacuum science & technology |
| Volume | 20 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 1981 Jan 1 |
| Externally published | Yes |
| Event | Proc of the Natl Symp of the Am Vac Soc, Pt 1 - Anaheim, Calif, USA Duration: 1981 Nov 2 → 1981 Nov 6 |
Fingerprint
ASJC Scopus subject areas
- Engineering(all)
Cite this
SPECTROSCOPIC TECHNIQUES FOR THE STUDY OF SOLID-LIQUID INTERFACES. / Yeager, E.; Homa, A.; Cahan, B. D.; Scherson, Daniel Alberto.
In: Journal of vacuum science & technology, Vol. 20, No. 3, 01.01.1981, p. 628-633.Research output: Contribution to journal › Conference article
}
TY - JOUR
T1 - SPECTROSCOPIC TECHNIQUES FOR THE STUDY OF SOLID-LIQUID INTERFACES.
AU - Yeager, E.
AU - Homa, A.
AU - Cahan, B. D.
AU - Scherson, Daniel Alberto
PY - 1981/1/1
Y1 - 1981/1/1
N2 - Substantial progress has been made with in-situ use of optical reflectance spectroscopy and Raman spectroscopy in studies of the properties of solid-liquid interfaces and particularly metal- and semiconductor-electrolyte interfaces. Such techniques provide molecular level information concerning adsorbed species and various thin films not available from electrochemical and other measurements. Ex-situ techniques including electron and ion spectroscopies also have proved helpful in understanding the properties of solid-liquid interfaces but special techniques are necessary to minimize changes in the surface structure of the solid during the transfer between the liquid and ultrahigh vacuum environment. Some of the results obtained recently by various workers using such transfer techniques in the study of adsorption on single crystals at electrochemical interfaces are reviewed. For adsorption on some solid surfaces there is parallel behavior in the liquid and vacuum environments and comparison affords insight as to the interactions of the adsorbed species at solid-liquid interfaces.
AB - Substantial progress has been made with in-situ use of optical reflectance spectroscopy and Raman spectroscopy in studies of the properties of solid-liquid interfaces and particularly metal- and semiconductor-electrolyte interfaces. Such techniques provide molecular level information concerning adsorbed species and various thin films not available from electrochemical and other measurements. Ex-situ techniques including electron and ion spectroscopies also have proved helpful in understanding the properties of solid-liquid interfaces but special techniques are necessary to minimize changes in the surface structure of the solid during the transfer between the liquid and ultrahigh vacuum environment. Some of the results obtained recently by various workers using such transfer techniques in the study of adsorption on single crystals at electrochemical interfaces are reviewed. For adsorption on some solid surfaces there is parallel behavior in the liquid and vacuum environments and comparison affords insight as to the interactions of the adsorbed species at solid-liquid interfaces.
UR - http://www.scopus.com/inward/record.url?scp=0019536946&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0019536946&partnerID=8YFLogxK
U2 - 10.1116/1.571411
DO - 10.1116/1.571411
M3 - Conference article
VL - 20
SP - 628
EP - 633
JO - Journal of Vacuum Science and Technology
JF - Journal of Vacuum Science and Technology
SN - 0022-5355
IS - 3
ER -