| Original language | English |
|---|---|
| Title of host publication | Proceedings - International Conference on Pattern Recognition |
| Publisher | IEEE |
| Pages | 932-937 |
| Number of pages | 6 |
| Publication status | Published - 1982 |
| Externally published | Yes |
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Expert systems
ASJC Scopus subject areas
- Computer Vision and Pattern Recognition
- Hardware and Architecture
- Electrical and Electronic Engineering
Cite this
Ishizuka, M., Fu, K. S., & Yao, J. T. P. (1982). SPERIL: AN EXPERT SYSTEM FOR DAMAGE ASSESSMENT OF EXISTING STRUCTURES. In Proceedings - International Conference on Pattern Recognition (pp. 932-937). IEEE.
SPERIL : AN EXPERT SYSTEM FOR DAMAGE ASSESSMENT OF EXISTING STRUCTURES. / Ishizuka, Mitsuru; Fu, K. S.; Yao, James T P.
Proceedings - International Conference on Pattern Recognition. IEEE, 1982. p. 932-937.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Ishizuka, M, Fu, KS & Yao, JTP 1982, SPERIL: AN EXPERT SYSTEM FOR DAMAGE ASSESSMENT OF EXISTING STRUCTURES. in Proceedings - International Conference on Pattern Recognition. IEEE, pp. 932-937.
Ishizuka M, Fu KS, Yao JTP. SPERIL: AN EXPERT SYSTEM FOR DAMAGE ASSESSMENT OF EXISTING STRUCTURES. In Proceedings - International Conference on Pattern Recognition. IEEE. 1982. p. 932-937
@inproceedings{31efb103d5f44532bcfe4494b75e9f16,
title = "SPERIL: AN EXPERT SYSTEM FOR DAMAGE ASSESSMENT OF EXISTING STRUCTURES.",
author = "Mitsuru Ishizuka and Fu, {K. S.} and Yao, {James T P}",
year = "1982",
language = "English",
pages = "932--937",
booktitle = "Proceedings - International Conference on Pattern Recognition",
publisher = "IEEE",
}
TY - GEN
T1 - SPERIL
T2 - AN EXPERT SYSTEM FOR DAMAGE ASSESSMENT OF EXISTING STRUCTURES.
AU - Ishizuka, Mitsuru
AU - Fu, K. S.
AU - Yao, James T P
PY - 1982
Y1 - 1982
UR - http://www.scopus.com/inward/record.url?scp=0020274607&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0020274607&partnerID=8YFLogxK
M3 - Conference contribution
SP - 932
EP - 937
BT - Proceedings - International Conference on Pattern Recognition
PB - IEEE
ER -