Standard materials and metrology for nanotechnology (SMAM-2)

Shingo Ichimura, Tomizo Kurosawa, Toshiyuki Fujimoto, Hidehiko Nonaka

Research output: Contribution to journalEditorial

Original languageEnglish
JournalMeasurement Science and Technology
Volume18
Issue number9
DOIs
Publication statusPublished - 2007 Sep 1
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation
  • Applied Mathematics

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