TY - GEN
T1 - State-dependent changeable scan architecture against scan-based side channel attacks
AU - Nara, Ryuta
AU - Atobe, Hiroshi
AU - Shi, Youhua
AU - Togawa, Nozomu
AU - Yanagisawa, Masao
AU - Ohtsuki, Tatsuo
PY - 2010/8/31
Y1 - 2010/8/31
N2 - Scan test is a powerful and popular test technique because it can control and observe the internal states of the circuit under test. However, scan path would be used to discover the internals of crypto hardware, which presents a significant security risk of information leakage. An interesting design-for-test technique by inserting inverters into the internal scan path to complicate the scan structure has been recently presented. Unfortunately, it still carries the potential of being attacked through statistical analysis of the information scanned out from chips. Therefore, in this paper we propose secure scan architecture, called dynamic variable secure scan, against scan-based side channel attack. The modified scan flip-flops are state-dependent, which could cause the output of each State-dependent Scan FF to be inverted or not so as to make it more difficult to discover the internal scan architecture.
AB - Scan test is a powerful and popular test technique because it can control and observe the internal states of the circuit under test. However, scan path would be used to discover the internals of crypto hardware, which presents a significant security risk of information leakage. An interesting design-for-test technique by inserting inverters into the internal scan path to complicate the scan structure has been recently presented. Unfortunately, it still carries the potential of being attacked through statistical analysis of the information scanned out from chips. Therefore, in this paper we propose secure scan architecture, called dynamic variable secure scan, against scan-based side channel attack. The modified scan flip-flops are state-dependent, which could cause the output of each State-dependent Scan FF to be inverted or not so as to make it more difficult to discover the internal scan architecture.
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U2 - 10.1109/ISCAS.2010.5537859
DO - 10.1109/ISCAS.2010.5537859
M3 - Conference contribution
AN - SCOPUS:77955989233
SN - 9781424453085
T3 - ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems
SP - 1867
EP - 1870
BT - ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems
T2 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems, ISCAS 2010
Y2 - 30 May 2010 through 2 June 2010
ER -