State-dependent changeable scan architecture against scan-based side channel attacks

Ryuta Nara, Hiroshi Atobe, Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Abstract

Scan test is a powerful and popular test technique because it can control and observe the internal states of the circuit under test. However, scan path would be used to discover the internals of crypto hardware, which presents a significant security risk of information leakage. An interesting design-for-test technique by inserting inverters into the internal scan path to complicate the scan structure has been recently presented. Unfortunately, it still carries the potential of being attacked through statistical analysis of the information scanned out from chips. Therefore, in this paper we propose secure scan architecture, called dynamic variable secure scan, against scan-based side channel attack. The modified scan flip-flops are state-dependent, which could cause the output of each State-dependent Scan FF to be inverted or not so as to make it more difficult to discover the internal scan architecture.

Original languageEnglish
Title of host publicationISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems
Subtitle of host publicationNano-Bio Circuit Fabrics and Systems
Pages1867-1870
Number of pages4
DOIs
Publication statusPublished - 2010 Aug 31
Event2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems, ISCAS 2010 - Paris, France
Duration: 2010 May 302010 Jun 2

Publication series

NameISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems

Conference

Conference2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems, ISCAS 2010
CountryFrance
CityParis
Period10/5/3010/6/2

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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