State-dependent changeable scan architecture against scan-based side channel attacks

Ryuta Nara, Hiroshi Atobe, Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    8 Citations (Scopus)

    Abstract

    Scan test is a powerful and popular test technique because it can control and observe the internal states of the circuit under test. However, scan path would be used to discover the internals of crypto hardware, which presents a significant security risk of information leakage. An interesting design-for-test technique by inserting inverters into the internal scan path to complicate the scan structure has been recently presented. Unfortunately, it still carries the potential of being attacked through statistical analysis of the information scanned out from chips. Therefore, in this paper we propose secure scan architecture, called dynamic variable secure scan, against scan-based side channel attack. The modified scan flip-flops are state-dependent, which could cause the output of each State-dependent Scan FF to be inverted or not so as to make it more difficult to discover the internal scan architecture.

    Original languageEnglish
    Title of host publicationISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems
    Pages1867-1870
    Number of pages4
    DOIs
    Publication statusPublished - 2010
    Event2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems, ISCAS 2010 - Paris
    Duration: 2010 May 302010 Jun 2

    Other

    Other2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems, ISCAS 2010
    CityParis
    Period10/5/3010/6/2

    Fingerprint

    Flip flop circuits
    Statistical methods
    Hardware
    Networks (circuits)
    Side channel attack

    ASJC Scopus subject areas

    • Hardware and Architecture
    • Electrical and Electronic Engineering

    Cite this

    Nara, R., Atobe, H., Shi, Y., Togawa, N., Yanagisawa, M., & Ohtsuki, T. (2010). State-dependent changeable scan architecture against scan-based side channel attacks. In ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems (pp. 1867-1870). [5537859] https://doi.org/10.1109/ISCAS.2010.5537859

    State-dependent changeable scan architecture against scan-based side channel attacks. / Nara, Ryuta; Atobe, Hiroshi; Shi, Youhua; Togawa, Nozomu; Yanagisawa, Masao; Ohtsuki, Tatsuo.

    ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems. 2010. p. 1867-1870 5537859.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Nara, R, Atobe, H, Shi, Y, Togawa, N, Yanagisawa, M & Ohtsuki, T 2010, State-dependent changeable scan architecture against scan-based side channel attacks. in ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems., 5537859, pp. 1867-1870, 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems, ISCAS 2010, Paris, 10/5/30. https://doi.org/10.1109/ISCAS.2010.5537859
    Nara R, Atobe H, Shi Y, Togawa N, Yanagisawa M, Ohtsuki T. State-dependent changeable scan architecture against scan-based side channel attacks. In ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems. 2010. p. 1867-1870. 5537859 https://doi.org/10.1109/ISCAS.2010.5537859
    Nara, Ryuta ; Atobe, Hiroshi ; Shi, Youhua ; Togawa, Nozomu ; Yanagisawa, Masao ; Ohtsuki, Tatsuo. / State-dependent changeable scan architecture against scan-based side channel attacks. ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems. 2010. pp. 1867-1870
    @inproceedings{b89ba3e6c0ff418abca8ebd0a41c1f7a,
    title = "State-dependent changeable scan architecture against scan-based side channel attacks",
    abstract = "Scan test is a powerful and popular test technique because it can control and observe the internal states of the circuit under test. However, scan path would be used to discover the internals of crypto hardware, which presents a significant security risk of information leakage. An interesting design-for-test technique by inserting inverters into the internal scan path to complicate the scan structure has been recently presented. Unfortunately, it still carries the potential of being attacked through statistical analysis of the information scanned out from chips. Therefore, in this paper we propose secure scan architecture, called dynamic variable secure scan, against scan-based side channel attack. The modified scan flip-flops are state-dependent, which could cause the output of each State-dependent Scan FF to be inverted or not so as to make it more difficult to discover the internal scan architecture.",
    author = "Ryuta Nara and Hiroshi Atobe and Youhua Shi and Nozomu Togawa and Masao Yanagisawa and Tatsuo Ohtsuki",
    year = "2010",
    doi = "10.1109/ISCAS.2010.5537859",
    language = "English",
    isbn = "9781424453085",
    pages = "1867--1870",
    booktitle = "ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems",

    }

    TY - GEN

    T1 - State-dependent changeable scan architecture against scan-based side channel attacks

    AU - Nara, Ryuta

    AU - Atobe, Hiroshi

    AU - Shi, Youhua

    AU - Togawa, Nozomu

    AU - Yanagisawa, Masao

    AU - Ohtsuki, Tatsuo

    PY - 2010

    Y1 - 2010

    N2 - Scan test is a powerful and popular test technique because it can control and observe the internal states of the circuit under test. However, scan path would be used to discover the internals of crypto hardware, which presents a significant security risk of information leakage. An interesting design-for-test technique by inserting inverters into the internal scan path to complicate the scan structure has been recently presented. Unfortunately, it still carries the potential of being attacked through statistical analysis of the information scanned out from chips. Therefore, in this paper we propose secure scan architecture, called dynamic variable secure scan, against scan-based side channel attack. The modified scan flip-flops are state-dependent, which could cause the output of each State-dependent Scan FF to be inverted or not so as to make it more difficult to discover the internal scan architecture.

    AB - Scan test is a powerful and popular test technique because it can control and observe the internal states of the circuit under test. However, scan path would be used to discover the internals of crypto hardware, which presents a significant security risk of information leakage. An interesting design-for-test technique by inserting inverters into the internal scan path to complicate the scan structure has been recently presented. Unfortunately, it still carries the potential of being attacked through statistical analysis of the information scanned out from chips. Therefore, in this paper we propose secure scan architecture, called dynamic variable secure scan, against scan-based side channel attack. The modified scan flip-flops are state-dependent, which could cause the output of each State-dependent Scan FF to be inverted or not so as to make it more difficult to discover the internal scan architecture.

    UR - http://www.scopus.com/inward/record.url?scp=77955989233&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=77955989233&partnerID=8YFLogxK

    U2 - 10.1109/ISCAS.2010.5537859

    DO - 10.1109/ISCAS.2010.5537859

    M3 - Conference contribution

    SN - 9781424453085

    SP - 1867

    EP - 1870

    BT - ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems

    ER -