State dependent scan flip-flop with key-based configuration against scan-based side channel attack on RSA circuit

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

Scan test is one of the useful design for testability techniques, which can detect circuit failure efficiently. However, it has been reported that it's possible to retrieve secret keys from cryptographic LSIs through scan chains. Therefore testability and security contradicted to each other, and there is a need to an efficient design for testability circuit so as to satisfy both testability and security requirement. In this paper, a secure scan architecture against scan-based attack is proposed to achieve high security without compromising the testability. In our method, scan structure is dynamically changed by adding the latch to any FFs in the scan chain. We made an analysis on an RSA circuit implementation to show the effectiveness of the proposed method and discussed how our approach is resistant to scan-based attack.

Original languageEnglish
Title of host publication2012 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2012
Pages607-610
Number of pages4
DOIs
Publication statusPublished - 2012 Dec 1
Event2012 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2012 - Kaohsiung, Taiwan, Province of China
Duration: 2012 Dec 22012 Dec 5

Publication series

NameIEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS

Conference

Conference2012 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2012
CountryTaiwan, Province of China
CityKaohsiung
Period12/12/212/12/5

Keywords

  • RSA
  • scan chain
  • scan-based attack
  • secure scan architecture

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'State dependent scan flip-flop with key-based configuration against scan-based side channel attack on RSA circuit'. Together they form a unique fingerprint.

  • Cite this

    Atobe, Y., Shi, Y., Yanagisawa, M., & Togawa, N. (2012). State dependent scan flip-flop with key-based configuration against scan-based side channel attack on RSA circuit. In 2012 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2012 (pp. 607-610). [6419108] (IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS). https://doi.org/10.1109/APCCAS.2012.6419108