Static error analysis and optimization of faithfully truncated adders for area-power efficient FIR designs

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

Faithfully truncated adders are used for low cost FIR implementations in this paper, which improves state-of-the-art CSD-based FIR filter designs for further area and power reduction while meeting the accuracy requirement. As a solution to the accuracy loss caused by truncated adders, this paper performed a static error analysis of truncated adders. Furthermore, based upon our mathematical analysis, we show that, with a given accuracy constraint, an optimal truncated adder configuration can be effortlessly determined for area-power efficient FIR designs. Evaluation results on various FIR designs showed that 16.8%~35.4% reduction in area and 11.8%~27.9% in power saving can be achieved with the proposed optimal truncated adder designs within an average error of 1 ulp.

Original languageEnglish
Title of host publication2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728103976
DOIs
Publication statusPublished - 2019
Event2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Sapporo, Japan
Duration: 2019 May 262019 May 29

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume2019-May
ISSN (Print)0271-4310

Conference

Conference2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019
Country/TerritoryJapan
CitySapporo
Period19/5/2619/5/29

Keywords

  • Approximate computing
  • Area-power efficient
  • FIR filter
  • Low cost
  • Truncated adder

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Static error analysis and optimization of faithfully truncated adders for area-power efficient FIR designs'. Together they form a unique fingerprint.

Cite this