Statics of Pin Corona Charger in Electrophotography

Hiroyuki Kawamoto, Kosuke Takasaki, Hiromu Yasuda, Naohiro Kumagai

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)

    Abstract

    The electrostatic force acting on a pin electrode in a pin-to-plate corona discharge system was measured and numerically calculated by a static unipolar model. The model neglects the effects of diffusion and convection of charged particles. It is assumed that generation of ions takes place on a tip of the pin electrode and that surface electric field is less than the onset field of corona discharge. Numerical calculations were conducted using an iterative finite element method. Calculated voltage-current characteristics of the positive corona qualitatively agreed with the measured result that the corona discharge took place over a threshold voltage and the current was in the order of several ten microamperes. Trichel pulse was observed in case of negative corona and the negative corona current was large compared to the positive corona. Vertical electrostatic force was also measured and calculated. Although extremely small electrostatic pull force was induced if discharge did not take place, the force became repulsive and relatively large when the corona discharge took place. Force in negative corona was almost same with that in positive corona. Calculated force without discharge agreed with the measured but the calculation did not simulate repulsive characteristics at corona discharging. Convection of air must be included in the model. Effect of lean of the pin electrode has been also investigated. The present investigation is expected not only to realize a new ozone-free charger but also to clarify quantitative mechanisms of the bead carry-out in the magnetic brush development subsystem of electrophotography. In addition to these technologies related to the electrophotography, a unique method to drive liquid, named "electrostatic Moses effect," has found and reported. The method is expected to be utilized for a new ink jet printhead.

    Original languageEnglish
    Title of host publicationInternational Conference on Digital Printing Technologies
    Pages827-835
    Number of pages9
    Publication statusPublished - 2000
    EventIS and T's NIP16: International Conference on Digital Printing Technologies - Vancouver, BC
    Duration: 2000 Oct 152000 Oct 20

    Other

    OtherIS and T's NIP16: International Conference on Digital Printing Technologies
    CityVancouver, BC
    Period00/10/1500/10/20

    Fingerprint

    Electrostatic force
    Electrodes
    Brushes
    Charged particles
    Current voltage characteristics
    Threshold voltage
    Ink
    Ozone
    Electrostatics
    Electric fields
    Finite element method
    Ions
    Liquids
    Air
    Convection

    ASJC Scopus subject areas

    • Media Technology

    Cite this

    Kawamoto, H., Takasaki, K., Yasuda, H., & Kumagai, N. (2000). Statics of Pin Corona Charger in Electrophotography. In International Conference on Digital Printing Technologies (pp. 827-835)

    Statics of Pin Corona Charger in Electrophotography. / Kawamoto, Hiroyuki; Takasaki, Kosuke; Yasuda, Hiromu; Kumagai, Naohiro.

    International Conference on Digital Printing Technologies. 2000. p. 827-835.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Kawamoto, H, Takasaki, K, Yasuda, H & Kumagai, N 2000, Statics of Pin Corona Charger in Electrophotography. in International Conference on Digital Printing Technologies. pp. 827-835, IS and T's NIP16: International Conference on Digital Printing Technologies, Vancouver, BC, 00/10/15.
    Kawamoto H, Takasaki K, Yasuda H, Kumagai N. Statics of Pin Corona Charger in Electrophotography. In International Conference on Digital Printing Technologies. 2000. p. 827-835
    Kawamoto, Hiroyuki ; Takasaki, Kosuke ; Yasuda, Hiromu ; Kumagai, Naohiro. / Statics of Pin Corona Charger in Electrophotography. International Conference on Digital Printing Technologies. 2000. pp. 827-835
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