Statistically accurate analysis of line width roughness based on discrete power spectrum

Atsushi Hiraiwa, Akio Nishida

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Citations (Scopus)

Fingerprint Dive into the research topics of 'Statistically accurate analysis of line width roughness based on discrete power spectrum'. Together they form a unique fingerprint.

Mathematics

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy