Stein's unbiased risk estimate (SURE) and distance constraint combined image denoising in Wavelet domain

Qieshi Zhang, Seiichiro Kamata

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Image denoising is a lively research field now. For solving this problem, non-linear filters based methods are the classical approach. These methods are based on local analysis of pixels with a moving window in spatial domain, but also have some shortcoming. Recently, because of the properties of Wavelet transform, this research has been focused on the wavelet domain. Compared to the classical nonlinear filters, the global multi-scale analysis characteristic of Wavelet is better for image denoising. So this paper proposed a new approach to use orthonormal Wavelet transform and distance constraint to solve this. Here, by minimizing the Stein's unbiased risk estimate (SURE) method to calculate the low frequency sub-band images for estimating. And convert the high frequency sub-band images to feature space, then use distance constraint to denoise by trained samples set. The experimental results show that the proposed method is efficiency and keep the detail ideally.

Original languageEnglish
Title of host publicationProceedings of the 7th IASTED International Conference on Signal Processing, Pattern Recognition and Applications, SPPRA 2010
Pages196-201
Number of pages6
Publication statusPublished - 2010
Event7th IASTED International Conference on Signal Processing, Pattern Recognition and Applications, SPPRA 2010 - Innsbruck
Duration: 2010 Feb 172010 Feb 19

Other

Other7th IASTED International Conference on Signal Processing, Pattern Recognition and Applications, SPPRA 2010
CityInnsbruck
Period10/2/1710/2/19

Fingerprint

Image denoising
Wavelet transforms
Pixels
field research
efficiency

Keywords

  • Distance constraint
  • Image denoising
  • Orthonormal Wavelet transform
  • Stein's unbiased risk estimate (SURE)

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Vision and Pattern Recognition
  • Signal Processing
  • Communication

Cite this

Zhang, Q., & Kamata, S. (2010). Stein's unbiased risk estimate (SURE) and distance constraint combined image denoising in Wavelet domain. In Proceedings of the 7th IASTED International Conference on Signal Processing, Pattern Recognition and Applications, SPPRA 2010 (pp. 196-201)

Stein's unbiased risk estimate (SURE) and distance constraint combined image denoising in Wavelet domain. / Zhang, Qieshi; Kamata, Seiichiro.

Proceedings of the 7th IASTED International Conference on Signal Processing, Pattern Recognition and Applications, SPPRA 2010. 2010. p. 196-201.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zhang, Q & Kamata, S 2010, Stein's unbiased risk estimate (SURE) and distance constraint combined image denoising in Wavelet domain. in Proceedings of the 7th IASTED International Conference on Signal Processing, Pattern Recognition and Applications, SPPRA 2010. pp. 196-201, 7th IASTED International Conference on Signal Processing, Pattern Recognition and Applications, SPPRA 2010, Innsbruck, 10/2/17.
Zhang Q, Kamata S. Stein's unbiased risk estimate (SURE) and distance constraint combined image denoising in Wavelet domain. In Proceedings of the 7th IASTED International Conference on Signal Processing, Pattern Recognition and Applications, SPPRA 2010. 2010. p. 196-201
Zhang, Qieshi ; Kamata, Seiichiro. / Stein's unbiased risk estimate (SURE) and distance constraint combined image denoising in Wavelet domain. Proceedings of the 7th IASTED International Conference on Signal Processing, Pattern Recognition and Applications, SPPRA 2010. 2010. pp. 196-201
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