STM observation of electroless-plated cobalt alloy thin films

Tetsuya Osaka, Takayuki Homma, Kingo Itaya, Shizuo Sugawara

Research output: Contribution to journalArticle

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Abstract

The microstructure of electroless-plated CoNiReP thin films in the initial deposition state were investigated by transmission electron microscopy (TEM), scanning electron microscopy (SEM) and scanning tunneling microscopy (STM). The films consisted of grains 30-50 nm in diameter. The result of STM observation presented a more detailed structure than that obtained by TEM and SEM. Also, the STM observation was effective in evaluating the minute structure of the films.

Original languageEnglish
Pages (from-to)465-467
Number of pages3
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume28
Issue number3
Publication statusPublished - 1989 Mar

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cobalt alloys
Cobalt alloys
Scanning tunneling microscopy
scanning tunneling microscopy
Thin films
thin films
Transmission electron microscopy
transmission electron microscopy
Scanning electron microscopy
scanning electron microscopy
microstructure
Microstructure

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

STM observation of electroless-plated cobalt alloy thin films. / Osaka, Tetsuya; Homma, Takayuki; Itaya, Kingo; Sugawara, Shizuo.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 28, No. 3, 03.1989, p. 465-467.

Research output: Contribution to journalArticle

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