Structural analysis of nanometer-size pyramid grown on an end of tungsten blunt tip

Tatsuhiro Nakagawa, E. Rokuta, G. Hashimoto, H. Murata, H. Shimoyama, C. Oshima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have fabricated nanometer-size pyramids (nanopyramids) on blunt W tips to apply for bright field emitter. The blunt tips were preliminarily given remolding treatment in order to sharpen their ends. The nanopyramids were grown on the tip end by being covered with thin layers of Pd and subsequently annealed at 1000 K. The structures of the specimen were analyzed by using filed ion microscopy (FIM). As a result, we have clarified detailed information about the atomic structures, of which the acquisition was not allowed in case that only FEM was employed. As far as the remolded W tips were concerned, the tip-end dimension of about 3 nm was narrowest possible for all the combinations of the remolding temperature and electric field. On the other hand, the grown nanopyramid with {211} sides and monoatomic-chain ridges exhibited even narrower summit. These findings are consistent with the contrasting behaviors of current stability data previously clarified by the FEM study.

Original languageEnglish
Title of host publicationProceedings - IVNC 2011: 2011 24th International Vacuum Nanoelectronics Conference
Pages51-52
Number of pages2
Publication statusPublished - 2011
Event2011 24th International Vacuum Nanoelectronics Conference, IVNC 2011 - Wuppertal
Duration: 2011 Jul 182011 Jul 22

Other

Other2011 24th International Vacuum Nanoelectronics Conference, IVNC 2011
CityWuppertal
Period11/7/1811/7/22

Fingerprint

Structural analysis
Tungsten
Finite element method
Convergence of numerical methods
Microscopic examination
Temperature distribution
Electric fields
Ions

Keywords

  • FIM
  • Remolding treatment
  • Single-atom emitter

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Nakagawa, T., Rokuta, E., Hashimoto, G., Murata, H., Shimoyama, H., & Oshima, C. (2011). Structural analysis of nanometer-size pyramid grown on an end of tungsten blunt tip. In Proceedings - IVNC 2011: 2011 24th International Vacuum Nanoelectronics Conference (pp. 51-52). [6004557]

Structural analysis of nanometer-size pyramid grown on an end of tungsten blunt tip. / Nakagawa, Tatsuhiro; Rokuta, E.; Hashimoto, G.; Murata, H.; Shimoyama, H.; Oshima, C.

Proceedings - IVNC 2011: 2011 24th International Vacuum Nanoelectronics Conference. 2011. p. 51-52 6004557.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nakagawa, T, Rokuta, E, Hashimoto, G, Murata, H, Shimoyama, H & Oshima, C 2011, Structural analysis of nanometer-size pyramid grown on an end of tungsten blunt tip. in Proceedings - IVNC 2011: 2011 24th International Vacuum Nanoelectronics Conference., 6004557, pp. 51-52, 2011 24th International Vacuum Nanoelectronics Conference, IVNC 2011, Wuppertal, 11/7/18.
Nakagawa T, Rokuta E, Hashimoto G, Murata H, Shimoyama H, Oshima C. Structural analysis of nanometer-size pyramid grown on an end of tungsten blunt tip. In Proceedings - IVNC 2011: 2011 24th International Vacuum Nanoelectronics Conference. 2011. p. 51-52. 6004557
Nakagawa, Tatsuhiro ; Rokuta, E. ; Hashimoto, G. ; Murata, H. ; Shimoyama, H. ; Oshima, C. / Structural analysis of nanometer-size pyramid grown on an end of tungsten blunt tip. Proceedings - IVNC 2011: 2011 24th International Vacuum Nanoelectronics Conference. 2011. pp. 51-52
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