Structural changes induced by KrF excimer laser photons in H2-loaded Ge-doped SiO2 glass

Makoto Fujimaki, Toshiaki Kasahara, Shigeyuki Shimoto, Nahoko Miyazaki, Shin Ichiro Tokuhiro, Kwang Soo Seol, Yoshimichi Ohki

Research output: Contribution to journalArticle

58 Citations (Scopus)

Abstract

Photochemical reactions related to the Ge lone-pair center (GLPC) that are induced by KrF excimer laser photons in H2-loaded Ge-doped SiO2 glass have been investigated. Without the H2 loading, the Ge electron center (GEC) and the positively charged GLPC were induced by the laser irradiation. In the H2-loaded sample, the GEC, the Ge E′ center, and the germyl radical (GR) were induced by the irradiation, while the positively charged GLPC was not observed after the irradiation. If the H2-loaded sample was thermally annealed after the photon irradiation, the concentration of the photo-induced GEC decreased monotonically with an increase in the annealing temperature. On the other hand, the concentration of the GR increased up to the annealing temperature of 160 °C, and it decreased at higher temperatures. Without the pre-irradiation, the induction of the GR was not observed even in the H2-loaded sample. From these results, it is concluded that the positively charged GLPC is terminated with a hydrogen atom in the H2-loaded sample and then becomes the GR by trapping an electron thermally released from the GEC.

Original languageEnglish
Pages (from-to)4682-4687
Number of pages6
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume60
Issue number7
DOIs
Publication statusPublished - 1999 Jan 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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