Structural studies of copper sulfide films: Effect of ambient atmosphere

Manisha Kundu, Tsuyoshi Hasegawa, Kazuya Terabe, Kazuhiro Yamamoto, Masakazu Aono

Research output: Contribution to journalArticle

46 Citations (Scopus)

Abstract

We examined the structural properties of copper sulfide films as a function of the sulfurization time of 70-nm-thick Cu films. Copper sulfide films with various phases such as mixed metallic Cu-chalcocite, chalcocite, roxbyite, and covellite phases were formed with increasing sulfurization time. To evaluate the structural stability of various films, all the films were exposed to the ambient atmosphere for the same amount of time. Although the phase structure and stoichiometry of the films were maintained at a greater depth, the near-surface region of the films was oxidized and covered with overlayers of oxide, hydroxide, and/or sulfate species due to the exposure and reaction with the ambient atmosphere. The oxygen uptake and its reactivity with the copper sulfide film surfaces were enhanced with increasing sulfur content of the films. In addition, the type of divalent state of copper formed on the film surfaces depended on the phase structure, composition, and stoichiometry of the films.

Original languageEnglish
Article number035011
JournalScience and Technology of Advanced Materials
Volume9
Issue number3
DOIs
Publication statusPublished - 2008 Jul 1
Externally publishedYes

Fingerprint

Sulfides
Copper
Phase structure
Stoichiometry
Sulfur
Oxides
Sulfates
Structural properties
Oxygen

Keywords

  • Copper sulfide
  • X-ray diffraction
  • X-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Structural studies of copper sulfide films : Effect of ambient atmosphere. / Kundu, Manisha; Hasegawa, Tsuyoshi; Terabe, Kazuya; Yamamoto, Kazuhiro; Aono, Masakazu.

In: Science and Technology of Advanced Materials, Vol. 9, No. 3, 035011, 01.07.2008.

Research output: Contribution to journalArticle

Kundu, Manisha ; Hasegawa, Tsuyoshi ; Terabe, Kazuya ; Yamamoto, Kazuhiro ; Aono, Masakazu. / Structural studies of copper sulfide films : Effect of ambient atmosphere. In: Science and Technology of Advanced Materials. 2008 ; Vol. 9, No. 3.
@article{bb61327650824bad8753b3c08a8bb67c,
title = "Structural studies of copper sulfide films: Effect of ambient atmosphere",
abstract = "We examined the structural properties of copper sulfide films as a function of the sulfurization time of 70-nm-thick Cu films. Copper sulfide films with various phases such as mixed metallic Cu-chalcocite, chalcocite, roxbyite, and covellite phases were formed with increasing sulfurization time. To evaluate the structural stability of various films, all the films were exposed to the ambient atmosphere for the same amount of time. Although the phase structure and stoichiometry of the films were maintained at a greater depth, the near-surface region of the films was oxidized and covered with overlayers of oxide, hydroxide, and/or sulfate species due to the exposure and reaction with the ambient atmosphere. The oxygen uptake and its reactivity with the copper sulfide film surfaces were enhanced with increasing sulfur content of the films. In addition, the type of divalent state of copper formed on the film surfaces depended on the phase structure, composition, and stoichiometry of the films.",
keywords = "Copper sulfide, X-ray diffraction, X-ray photoelectron spectroscopy",
author = "Manisha Kundu and Tsuyoshi Hasegawa and Kazuya Terabe and Kazuhiro Yamamoto and Masakazu Aono",
year = "2008",
month = "7",
day = "1",
doi = "10.1088/1468-6996/9/3/035011",
language = "English",
volume = "9",
journal = "Science and Technology of Advanced Materials",
issn = "1468-6996",
publisher = "IOP Publishing Ltd.",
number = "3",

}

TY - JOUR

T1 - Structural studies of copper sulfide films

T2 - Effect of ambient atmosphere

AU - Kundu, Manisha

AU - Hasegawa, Tsuyoshi

AU - Terabe, Kazuya

AU - Yamamoto, Kazuhiro

AU - Aono, Masakazu

PY - 2008/7/1

Y1 - 2008/7/1

N2 - We examined the structural properties of copper sulfide films as a function of the sulfurization time of 70-nm-thick Cu films. Copper sulfide films with various phases such as mixed metallic Cu-chalcocite, chalcocite, roxbyite, and covellite phases were formed with increasing sulfurization time. To evaluate the structural stability of various films, all the films were exposed to the ambient atmosphere for the same amount of time. Although the phase structure and stoichiometry of the films were maintained at a greater depth, the near-surface region of the films was oxidized and covered with overlayers of oxide, hydroxide, and/or sulfate species due to the exposure and reaction with the ambient atmosphere. The oxygen uptake and its reactivity with the copper sulfide film surfaces were enhanced with increasing sulfur content of the films. In addition, the type of divalent state of copper formed on the film surfaces depended on the phase structure, composition, and stoichiometry of the films.

AB - We examined the structural properties of copper sulfide films as a function of the sulfurization time of 70-nm-thick Cu films. Copper sulfide films with various phases such as mixed metallic Cu-chalcocite, chalcocite, roxbyite, and covellite phases were formed with increasing sulfurization time. To evaluate the structural stability of various films, all the films were exposed to the ambient atmosphere for the same amount of time. Although the phase structure and stoichiometry of the films were maintained at a greater depth, the near-surface region of the films was oxidized and covered with overlayers of oxide, hydroxide, and/or sulfate species due to the exposure and reaction with the ambient atmosphere. The oxygen uptake and its reactivity with the copper sulfide film surfaces were enhanced with increasing sulfur content of the films. In addition, the type of divalent state of copper formed on the film surfaces depended on the phase structure, composition, and stoichiometry of the films.

KW - Copper sulfide

KW - X-ray diffraction

KW - X-ray photoelectron spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=58149393353&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=58149393353&partnerID=8YFLogxK

U2 - 10.1088/1468-6996/9/3/035011

DO - 10.1088/1468-6996/9/3/035011

M3 - Article

AN - SCOPUS:58149393353

VL - 9

JO - Science and Technology of Advanced Materials

JF - Science and Technology of Advanced Materials

SN - 1468-6996

IS - 3

M1 - 035011

ER -