Four-circle x-ray diffraction measurements were carried out on a single crystal of Bi2.1Sr1.9-Ca2Cu3O 10+δ with doping levels from underdoped to overdoped. The excess charge of each inequivalent CuO2 plane was estimated using the obtained inter-atomic distances in two ways by means of the bond-valence-sum method. The copper valence and the valence sum of the copper and the surrounding oxygen ions gave contradictory results for the inhomogeneous charge distribution of the inequivalent CuO2 planes.
- Bond-valence-sum (BVS) method
- Four-circle x-ray diffraction measurement
- High-T cuprate
- Out-of-plane resistivity
- Single crystal
ASJC Scopus subject areas
- Physics and Astronomy(all)