Structural study of inhomogeneous charge distribution of inequivalent CuO2 planes in Bi2.1Sr1.9Ca2Cu 3O10+δ single crystals

Takao Watanabe, Takenori Fujii, Azusa Matsuda

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Four-circle x-ray diffraction measurements were carried out on a single crystal of Bi2.1Sr1.9-Ca2Cu3O 10+δ with doping levels from underdoped to overdoped. The excess charge of each inequivalent CuO2 plane was estimated using the obtained inter-atomic distances in two ways by means of the bond-valence-sum method. The copper valence and the valence sum of the copper and the surrounding oxygen ions gave contradictory results for the inhomogeneous charge distribution of the inequivalent CuO2 planes.

Original languageEnglish
Pages (from-to)2924-2929
Number of pages6
JournalJournal of the Physical Society of Japan
Volume72
Issue number11
DOIs
Publication statusPublished - 2003 Nov
Externally publishedYes

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charge distribution
valence
single crystals
copper
oxygen ions
x ray diffraction

Keywords

  • BiSrCaCuO
  • Bond-valence-sum (BVS) method
  • Four-circle x-ray diffraction measurement
  • High-T cuprate
  • Out-of-plane resistivity
  • Single crystal

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Structural study of inhomogeneous charge distribution of inequivalent CuO2 planes in Bi2.1Sr1.9Ca2Cu 3O10+δ single crystals. / Watanabe, Takao; Fujii, Takenori; Matsuda, Azusa.

In: Journal of the Physical Society of Japan, Vol. 72, No. 11, 11.2003, p. 2924-2929.

Research output: Contribution to journalArticle

@article{26619568ffcb4f02a841325272f20dab,
title = "Structural study of inhomogeneous charge distribution of inequivalent CuO2 planes in Bi2.1Sr1.9Ca2Cu 3O10+δ single crystals",
abstract = "Four-circle x-ray diffraction measurements were carried out on a single crystal of Bi2.1Sr1.9-Ca2Cu3O 10+δ with doping levels from underdoped to overdoped. The excess charge of each inequivalent CuO2 plane was estimated using the obtained inter-atomic distances in two ways by means of the bond-valence-sum method. The copper valence and the valence sum of the copper and the surrounding oxygen ions gave contradictory results for the inhomogeneous charge distribution of the inequivalent CuO2 planes.",
keywords = "BiSrCaCuO, Bond-valence-sum (BVS) method, Four-circle x-ray diffraction measurement, High-T cuprate, Out-of-plane resistivity, Single crystal",
author = "Takao Watanabe and Takenori Fujii and Azusa Matsuda",
year = "2003",
month = "11",
doi = "10.1143/JPSJ.72.2924",
language = "English",
volume = "72",
pages = "2924--2929",
journal = "Journal of the Physical Society of Japan",
issn = "0031-9015",
publisher = "Physical Society of Japan",
number = "11",

}

TY - JOUR

T1 - Structural study of inhomogeneous charge distribution of inequivalent CuO2 planes in Bi2.1Sr1.9Ca2Cu 3O10+δ single crystals

AU - Watanabe, Takao

AU - Fujii, Takenori

AU - Matsuda, Azusa

PY - 2003/11

Y1 - 2003/11

N2 - Four-circle x-ray diffraction measurements were carried out on a single crystal of Bi2.1Sr1.9-Ca2Cu3O 10+δ with doping levels from underdoped to overdoped. The excess charge of each inequivalent CuO2 plane was estimated using the obtained inter-atomic distances in two ways by means of the bond-valence-sum method. The copper valence and the valence sum of the copper and the surrounding oxygen ions gave contradictory results for the inhomogeneous charge distribution of the inequivalent CuO2 planes.

AB - Four-circle x-ray diffraction measurements were carried out on a single crystal of Bi2.1Sr1.9-Ca2Cu3O 10+δ with doping levels from underdoped to overdoped. The excess charge of each inequivalent CuO2 plane was estimated using the obtained inter-atomic distances in two ways by means of the bond-valence-sum method. The copper valence and the valence sum of the copper and the surrounding oxygen ions gave contradictory results for the inhomogeneous charge distribution of the inequivalent CuO2 planes.

KW - BiSrCaCuO

KW - Bond-valence-sum (BVS) method

KW - Four-circle x-ray diffraction measurement

KW - High-T cuprate

KW - Out-of-plane resistivity

KW - Single crystal

UR - http://www.scopus.com/inward/record.url?scp=0346264859&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0346264859&partnerID=8YFLogxK

U2 - 10.1143/JPSJ.72.2924

DO - 10.1143/JPSJ.72.2924

M3 - Article

AN - SCOPUS:0346264859

VL - 72

SP - 2924

EP - 2929

JO - Journal of the Physical Society of Japan

JF - Journal of the Physical Society of Japan

SN - 0031-9015

IS - 11

ER -