Structural study of inhomogeneous charge distribution of inequivalent CuO2 planes in Bi2.1Sr1.9Ca2Cu 3O10+δ single crystals

Takao Watanabe, Takenori Fujii, Azusa Matsuda

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)


Four-circle x-ray diffraction measurements were carried out on a single crystal of Bi2.1Sr1.9-Ca2Cu3O 10+δ with doping levels from underdoped to overdoped. The excess charge of each inequivalent CuO2 plane was estimated using the obtained inter-atomic distances in two ways by means of the bond-valence-sum method. The copper valence and the valence sum of the copper and the surrounding oxygen ions gave contradictory results for the inhomogeneous charge distribution of the inequivalent CuO2 planes.

Original languageEnglish
Pages (from-to)2924-2929
Number of pages6
Journaljournal of the physical society of japan
Issue number11
Publication statusPublished - 2003 Nov 1
Externally publishedYes


  • BiSrCaCuO
  • Bond-valence-sum (BVS) method
  • Four-circle x-ray diffraction measurement
  • High-T cuprate
  • Out-of-plane resistivity
  • Single crystal

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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