STRUCTURAL STUDY OF ZnSe-ZnTe STRAINED LAYER SUPERLATTICE ON InP SUBSTRATE PREPARED BY MBE.

Hironori Katagiri, Masakazu Kobayashi, Naoki Mino, Kazuyori Urabe, Makoto Konagai, Kiyoshi Takahashi

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Direct observation of ZnSe-ZnTe strained layer superlattice was performed by transmission electron microscopy. The long periodicity of the superlattice was confirmed by the satellite spots of transmissin electron diffraction. The bright field TEM image indicated the superlattice structure without large scale misfit dislocations.

Original languageEnglish
Pages (from-to)277-278
Number of pages2
JournalTransactions of the Institute of Electronics and Communication Engineers of Japan. Section E
VolumeE69
Issue number4
Publication statusPublished - 1986 Apr
Externally publishedYes

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Molecular beam epitaxy
Transmission electron microscopy
Dislocations (crystals)
Electron diffraction
Satellites

ASJC Scopus subject areas

  • Engineering(all)

Cite this

STRUCTURAL STUDY OF ZnSe-ZnTe STRAINED LAYER SUPERLATTICE ON InP SUBSTRATE PREPARED BY MBE. / Katagiri, Hironori; Kobayashi, Masakazu; Mino, Naoki; Urabe, Kazuyori; Konagai, Makoto; Takahashi, Kiyoshi.

In: Transactions of the Institute of Electronics and Communication Engineers of Japan. Section E, Vol. E69, No. 4, 04.1986, p. 277-278.

Research output: Contribution to journalArticle

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