Direct observation of ZnSe-ZnTe strained layer superlattice was performed by transmission electron microscopy. The long periodicity of the superlattice was confirmed by the satellite spots of transmissin electron diffraction. The bright field TEM image indicated the superlattice structure without large scale misfit dislocations.
|Number of pages||2|
|Journal||Transactions of the Institute of Electronics and Communication Engineers of Japan. Section E|
|Publication status||Published - 1986 Apr|
|Event||Pap from 1986 Natl Conv IECE Jpn - Niigata, Jpn|
Duration: 1986 Mar 23 → 1986 Mar 26
ASJC Scopus subject areas