Structure analysis of Ag overlayers on Si(111) by low-energy Li+ ion scattering

M. Aono, R. Souda, C. Oshima, Y. Ishizawa

    Research output: Contribution to journalArticle

    54 Citations (Scopus)

    Abstract

    The structures of various Ag overlayers on the Si(111) surface have been analyzed by impact-collision ion scattering spectroscopy (ICISS) using a beam of Li+ ions of ≈ 1 keV. The Ag overlayers include (i) Ag crystallites deposited at room temperature, (ii) Ag atoms at the Si(111)-(√3×√3)Ag surface, (iii) Ag atoms at the Si(111)-(3×1)Ag surface, and (iv) a (111) epitaxial film of Ag with a thickness of ≈ 20 A ̊.

    Original languageEnglish
    Pages (from-to)713-723
    Number of pages11
    JournalSurface Science
    Volume168
    Issue number1-3
    DOIs
    Publication statusPublished - 1986 Mar 3

      Fingerprint

    ASJC Scopus subject areas

    • Physical and Theoretical Chemistry
    • Condensed Matter Physics
    • Surfaces and Interfaces

    Cite this