In this study, a new CoNiFe thin film was prepared from the bath with organic additive in order to increase resistivity. Resistivity value was measured by a four-probe method, while the film composition was analyzed by the X-ray fluorescence (XRF). The crystal structure was characterized by X-ray diffraction (XRD, Fe-Kα).
|Journal||Digests of the Intermag Conference|
|Publication status||Published - 1999 Dec 1|
|Event||Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea|
Duration: 1999 May 18 → 1999 May 21
ASJC Scopus subject areas
- Electrical and Electronic Engineering