Study on solid structure of pentacene thin films using Raman imaging

Keisuke Seto, Yukio Furukawa

    Research output: Contribution to journalArticle

    18 Citations (Scopus)

    Abstract

    We present a 532-nm excited Raman imaging study of pentacene thin films (thickness, 2, 5, 10, 20, 50, 100, and 150 nm) prepared on an SiO2 surface. The structure of the pentacene films has been investigated by images and histograms of the ratio (R) of intensity of the 1596-cm-1 band (b3g) to that of the 1533-cm-1 band (ag), which can be used as a marker of solid-state phases: 1.54-nm and 1.44-nm phases. The Raman images showed that island-like 1.44-nm phase domains are grown on the 1.54-nm phase layer from 50 nm, and all the surface of the 1.54-nm phase layer is covered with the 1.44-nm phase layer from 100 nm. The structural disorders have been discussed on the basis of the full width at half maximum of a band in the histogram of the R values for each film.

    Original languageEnglish
    Pages (from-to)2015-2019
    Number of pages5
    JournalJournal of Raman Spectroscopy
    Volume43
    Issue number12
    DOIs
    Publication statusPublished - 2012 Dec

    Fingerprint

    Imaging techniques
    Thin films
    Full width at half maximum
    Film thickness
    pentacene

    Keywords

    • organic semiconductors
    • organic thin films
    • pentacene
    • Raman chemical imaging

    ASJC Scopus subject areas

    • Spectroscopy
    • Materials Science(all)

    Cite this

    Study on solid structure of pentacene thin films using Raman imaging. / Seto, Keisuke; Furukawa, Yukio.

    In: Journal of Raman Spectroscopy, Vol. 43, No. 12, 12.2012, p. 2015-2019.

    Research output: Contribution to journalArticle

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