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Suppression of charge carrier collection in diode with retrograde well and epitaxial layers for soft-error immunity
T. Kishimoto*, M. Takai, Y. Ohno, T. Nishimura, M. Inuishi, A. Kinomura, Y. Horino, K. Fujii
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
1
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(Scopus)