Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction

H. Nakamura, N. Fujihara, M. Nojima, K. Tamura, H. Ishii, M. Owari, C. Oshima, Y. Nihei

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

For surface structural analysis on monolayer films composed of light elements, we investigated theoretical x-ray photoelectron diffraction (XPED) patterns from single-molecule adsorbing surfaces by using both Cr La (572.8 eV) and Al Kα (1486.6 eV) excitations. Forward-scattering peaks and Kikuchi-like bands were clearly observed in the pattern excited by Al Kα. In contrast, the features of the XPED patterns excited by Cr La were more diffuse. However, the circular patterns excited by Cr La are clearer than those excited by Al Ka. This result suggests that the use of a lower energy x-ray source improves XPED structural analysis on ultrathin films composed of light elements.

Original languageEnglish
Pages (from-to)1513-1515
Number of pages3
JournalSurface and Interface Analysis
Volume36
Issue number12
DOIs
Publication statusPublished - 2004 Dec

Keywords

  • Circular pattern
  • Kikuchi-like band
  • Light elements
  • X-ray photoelectron diffraction

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Colloid and Surface Chemistry

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    Nakamura, H., Fujihara, N., Nojima, M., Tamura, K., Ishii, H., Owari, M., Oshima, C., & Nihei, Y. (2004). Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction. Surface and Interface Analysis, 36(12), 1513-1515. https://doi.org/10.1002/sia.1935