Surface structure analysis of Zr-O/W(100) at high temperature by x-ray photoelectron diffraction

Keiji Tamura, Mikiya Amano, Wei Guo Chu, Hideshi Ishii, Masanori Owari, Takashi Kawano, Takakiyo Nagatomi, Yoshizo Takai, Chuhei Oshima, Ryuichi Shimizu, Yoshimasa Nihei

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Temperature dependence of the surface structure of Zr-O/W(100) was obtained by low-energy electron diffraction observation to check the phase transition of the surface. After flashing the Zr-O/W(100) to 1500 K, the c(2 × 4) + c(4 × 2) double-domain structure was clearly observed at room temperature. This surface changed to the p(1 × 1) phase over 1300 K, accompanied by a decrease in the work function. The temperature dependence of the work function was obtained from the shift of the energy distributions of secondary electrons. The reversible phase transition of the Zr-O/W(100) surface and the decrease in the work function of 2 eV at high temperature were checked. X-ray photoelectron diffraction (XPD) measurements at 1500 K have been performed to investigate the surface structure at the working temperature of the Zr-O/W(100) electron emitter. The O1s XPED pattern included some patterns that can be regarded as the influence of Zr-O complexes on the W(100) surface.

Original languageEnglish
Pages (from-to)217-220
Number of pages4
JournalSurface and Interface Analysis
Volume37
Issue number2
DOIs
Publication statusPublished - 2005 Feb

Fingerprint

Photoelectrons
Surface structure
photoelectrons
Diffraction
X rays
diffraction
x rays
Temperature
Phase transitions
Electrons
Low energy electron diffraction
temperature dependence
energy distribution
emitters
electrons
electron diffraction
shift
room temperature

Keywords

  • Secondary electron
  • Thermal field emission
  • Work function
  • X-ray photoelectron diffraction
  • Zirconium

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Colloid and Surface Chemistry

Cite this

Tamura, K., Amano, M., Chu, W. G., Ishii, H., Owari, M., Kawano, T., ... Nihei, Y. (2005). Surface structure analysis of Zr-O/W(100) at high temperature by x-ray photoelectron diffraction. Surface and Interface Analysis, 37(2), 217-220. https://doi.org/10.1002/sia.1968

Surface structure analysis of Zr-O/W(100) at high temperature by x-ray photoelectron diffraction. / Tamura, Keiji; Amano, Mikiya; Chu, Wei Guo; Ishii, Hideshi; Owari, Masanori; Kawano, Takashi; Nagatomi, Takakiyo; Takai, Yoshizo; Oshima, Chuhei; Shimizu, Ryuichi; Nihei, Yoshimasa.

In: Surface and Interface Analysis, Vol. 37, No. 2, 02.2005, p. 217-220.

Research output: Contribution to journalArticle

Tamura, K, Amano, M, Chu, WG, Ishii, H, Owari, M, Kawano, T, Nagatomi, T, Takai, Y, Oshima, C, Shimizu, R & Nihei, Y 2005, 'Surface structure analysis of Zr-O/W(100) at high temperature by x-ray photoelectron diffraction', Surface and Interface Analysis, vol. 37, no. 2, pp. 217-220. https://doi.org/10.1002/sia.1968
Tamura, Keiji ; Amano, Mikiya ; Chu, Wei Guo ; Ishii, Hideshi ; Owari, Masanori ; Kawano, Takashi ; Nagatomi, Takakiyo ; Takai, Yoshizo ; Oshima, Chuhei ; Shimizu, Ryuichi ; Nihei, Yoshimasa. / Surface structure analysis of Zr-O/W(100) at high temperature by x-ray photoelectron diffraction. In: Surface and Interface Analysis. 2005 ; Vol. 37, No. 2. pp. 217-220.
@article{a4405f4ae37c429d82714d89f530cf71,
title = "Surface structure analysis of Zr-O/W(100) at high temperature by x-ray photoelectron diffraction",
abstract = "Temperature dependence of the surface structure of Zr-O/W(100) was obtained by low-energy electron diffraction observation to check the phase transition of the surface. After flashing the Zr-O/W(100) to 1500 K, the c(2 × 4) + c(4 × 2) double-domain structure was clearly observed at room temperature. This surface changed to the p(1 × 1) phase over 1300 K, accompanied by a decrease in the work function. The temperature dependence of the work function was obtained from the shift of the energy distributions of secondary electrons. The reversible phase transition of the Zr-O/W(100) surface and the decrease in the work function of 2 eV at high temperature were checked. X-ray photoelectron diffraction (XPD) measurements at 1500 K have been performed to investigate the surface structure at the working temperature of the Zr-O/W(100) electron emitter. The O1s XPED pattern included some patterns that can be regarded as the influence of Zr-O complexes on the W(100) surface.",
keywords = "Secondary electron, Thermal field emission, Work function, X-ray photoelectron diffraction, Zirconium",
author = "Keiji Tamura and Mikiya Amano and Chu, {Wei Guo} and Hideshi Ishii and Masanori Owari and Takashi Kawano and Takakiyo Nagatomi and Yoshizo Takai and Chuhei Oshima and Ryuichi Shimizu and Yoshimasa Nihei",
year = "2005",
month = "2",
doi = "10.1002/sia.1968",
language = "English",
volume = "37",
pages = "217--220",
journal = "Surface and Interface Analysis",
issn = "0142-2421",
publisher = "John Wiley and Sons Ltd",
number = "2",

}

TY - JOUR

T1 - Surface structure analysis of Zr-O/W(100) at high temperature by x-ray photoelectron diffraction

AU - Tamura, Keiji

AU - Amano, Mikiya

AU - Chu, Wei Guo

AU - Ishii, Hideshi

AU - Owari, Masanori

AU - Kawano, Takashi

AU - Nagatomi, Takakiyo

AU - Takai, Yoshizo

AU - Oshima, Chuhei

AU - Shimizu, Ryuichi

AU - Nihei, Yoshimasa

PY - 2005/2

Y1 - 2005/2

N2 - Temperature dependence of the surface structure of Zr-O/W(100) was obtained by low-energy electron diffraction observation to check the phase transition of the surface. After flashing the Zr-O/W(100) to 1500 K, the c(2 × 4) + c(4 × 2) double-domain structure was clearly observed at room temperature. This surface changed to the p(1 × 1) phase over 1300 K, accompanied by a decrease in the work function. The temperature dependence of the work function was obtained from the shift of the energy distributions of secondary electrons. The reversible phase transition of the Zr-O/W(100) surface and the decrease in the work function of 2 eV at high temperature were checked. X-ray photoelectron diffraction (XPD) measurements at 1500 K have been performed to investigate the surface structure at the working temperature of the Zr-O/W(100) electron emitter. The O1s XPED pattern included some patterns that can be regarded as the influence of Zr-O complexes on the W(100) surface.

AB - Temperature dependence of the surface structure of Zr-O/W(100) was obtained by low-energy electron diffraction observation to check the phase transition of the surface. After flashing the Zr-O/W(100) to 1500 K, the c(2 × 4) + c(4 × 2) double-domain structure was clearly observed at room temperature. This surface changed to the p(1 × 1) phase over 1300 K, accompanied by a decrease in the work function. The temperature dependence of the work function was obtained from the shift of the energy distributions of secondary electrons. The reversible phase transition of the Zr-O/W(100) surface and the decrease in the work function of 2 eV at high temperature were checked. X-ray photoelectron diffraction (XPD) measurements at 1500 K have been performed to investigate the surface structure at the working temperature of the Zr-O/W(100) electron emitter. The O1s XPED pattern included some patterns that can be regarded as the influence of Zr-O complexes on the W(100) surface.

KW - Secondary electron

KW - Thermal field emission

KW - Work function

KW - X-ray photoelectron diffraction

KW - Zirconium

UR - http://www.scopus.com/inward/record.url?scp=19944432171&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=19944432171&partnerID=8YFLogxK

U2 - 10.1002/sia.1968

DO - 10.1002/sia.1968

M3 - Article

AN - SCOPUS:19944432171

VL - 37

SP - 217

EP - 220

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

SN - 0142-2421

IS - 2

ER -