Swift/BAT Calibration and the Estimated BAT Hard X-ray Survey Sensitivity

Ann Parsons*, Jack Tueller, Hans Krimm, Scott Barthelmy, Jay Cummings, Craig Markwardt, Derek Hullinger, Neil Gehrels, Ed Fenimore, David Palmer, Goro Sato, Kazuhiro Nakazawa, Tadayuki Takahashi, Shin Watanabe, Yuu Okada, Hiromitsu Takahashi, Masaya Suzuki, Makoto Tashiro

*Corresponding author for this work

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