Abstract
Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research.
| Original language | English |
|---|---|
| Pages (from-to) | 479-496 |
| Number of pages | 18 |
| Journal | TrAC - Trends in Analytical Chemistry |
| Volume | 29 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 2010 Jun |
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Keywords
- Angle-dependent measurement
- GI-XRF
- Glancing incident
- SR-TXRF
- Synchrotron radiation
- Total reflection X-ray fluorescence analysis
- TXRF
- TXRF-XANES
- X-ray absorption near-edge structure spectroscopy
ASJC Scopus subject areas
- Analytical Chemistry
- Spectroscopy
- Environmental Chemistry
Cite this
Synchrotron radiation-induced total reflection X-ray fluorescence analysis. / Meirer, F.; Singh, A.; Pianetta, P.; Pepponi, G.; Meirer, F.; Streli, C.; Homma, Takayuki.
In: TrAC - Trends in Analytical Chemistry, Vol. 29, No. 6, 06.2010, p. 479-496.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Synchrotron radiation-induced total reflection X-ray fluorescence analysis
AU - Meirer, F.
AU - Singh, A.
AU - Pianetta, P.
AU - Pepponi, G.
AU - Meirer, F.
AU - Streli, C.
AU - Homma, Takayuki
PY - 2010/6
Y1 - 2010/6
N2 - Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research.
AB - Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research.
KW - Angle-dependent measurement
KW - GI-XRF
KW - Glancing incident
KW - SR-TXRF
KW - Synchrotron radiation
KW - Total reflection X-ray fluorescence analysis
KW - TXRF
KW - TXRF-XANES
KW - X-ray absorption near-edge structure spectroscopy
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UR - http://www.scopus.com/inward/citedby.url?scp=77953083406&partnerID=8YFLogxK
U2 - 10.1016/j.trac.2010.04.001
DO - 10.1016/j.trac.2010.04.001
M3 - Article
AN - SCOPUS:77953083406
VL - 29
SP - 479
EP - 496
JO - TrAC - Trends in Analytical Chemistry
JF - TrAC - Trends in Analytical Chemistry
SN - 0165-9936
IS - 6
ER -