Abstract
Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research.
| Original language | English |
|---|---|
| Pages (from-to) | 479-496 |
| Number of pages | 18 |
| Journal | TrAC - Trends in Analytical Chemistry |
| Volume | 29 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 2010 Jun 1 |
Keywords
- Angle-dependent measurement
- GI-XRF
- Glancing incident
- SR-TXRF
- Synchrotron radiation
- TXRF
- TXRF-XANES
- Total reflection X-ray fluorescence analysis
- X-ray absorption near-edge structure spectroscopy
ASJC Scopus subject areas
- Analytical Chemistry
- Spectroscopy
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Cite this
Meirer, F., Singh, A., Pianetta, P., Pepponi, G., Meirer, F., Streli, C., & Homma, T. (2010). Synchrotron radiation-induced total reflection X-ray fluorescence analysis. TrAC - Trends in Analytical Chemistry, 29(6), 479-496. https://doi.org/10.1016/j.trac.2010.04.001