Synchrotron radiation-induced total reflection X-ray fluorescence analysis

F. Meirer; A. Singh; P. Pianetta; G. Pepponi; F. Meirer; C. Streli; T. Homma

doi:10.1016/j.trac.2010.04.001

Synchrotron radiation-induced total reflection X-ray fluorescence analysis

F. Meirer, A. Singh, P. Pianetta, G. Pepponi, F. Meirer, C. Streli, T. Homma

School of Advanced Science and Engineering

Research output: Contribution to journal › Review article › peer-review

42 Citations (Scopus)

Abstract

Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research.

Original language	English
Pages (from-to)	479-496
Number of pages	18
Journal	TrAC - Trends in Analytical Chemistry
Volume	29
Issue number	6
DOIs	https://doi.org/10.1016/j.trac.2010.04.001
Publication status	Published - 2010 Jun

Keywords

Angle-dependent measurement
GI-XRF
Glancing incident
SR-TXRF
Synchrotron radiation
TXRF
TXRF-XANES
Total reflection X-ray fluorescence analysis
X-ray absorption near-edge structure spectroscopy

ASJC Scopus subject areas

Analytical Chemistry
Spectroscopy

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10.1016/j.trac.2010.04.001

Cite this

@article{a070a4bd7e2e4011879f221d77539240,

title = "Synchrotron radiation-induced total reflection X-ray fluorescence analysis",

abstract = "Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research.",

keywords = "Angle-dependent measurement, GI-XRF, Glancing incident, SR-TXRF, Synchrotron radiation, TXRF, TXRF-XANES, Total reflection X-ray fluorescence analysis, X-ray absorption near-edge structure spectroscopy",

author = "F. Meirer and A. Singh and P. Pianetta and G. Pepponi and F. Meirer and C. Streli and T. Homma",

year = "2010",

month = jun,

doi = "10.1016/j.trac.2010.04.001",

language = "English",

volume = "29",

pages = "479--496",

journal = "TrAC - Trends in Analytical Chemistry",

issn = "0165-9936",

publisher = "Elsevier",

number = "6",

}

TY - JOUR

T1 - Synchrotron radiation-induced total reflection X-ray fluorescence analysis

AU - Meirer, F.

AU - Singh, A.

AU - Pianetta, P.

AU - Pepponi, G.

AU - Meirer, F.

AU - Streli, C.

AU - Homma, T.

PY - 2010/6

Y1 - 2010/6

N2 - Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research.

AB - Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research.

KW - Angle-dependent measurement

KW - GI-XRF

KW - Glancing incident

KW - SR-TXRF

KW - Synchrotron radiation

KW - TXRF

KW - TXRF-XANES

KW - Total reflection X-ray fluorescence analysis

KW - X-ray absorption near-edge structure spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=77953083406&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77953083406&partnerID=8YFLogxK

U2 - 10.1016/j.trac.2010.04.001

DO - 10.1016/j.trac.2010.04.001

M3 - Review article

AN - SCOPUS:77953083406

VL - 29

SP - 479

EP - 496

JO - TrAC - Trends in Analytical Chemistry

JF - TrAC - Trends in Analytical Chemistry

SN - 0165-9936

IS - 6

ER -

Synchrotron radiation-induced total reflection X-ray fluorescence analysis

Abstract

Keywords

ASJC Scopus subject areas

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