Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research.
- Angle-dependent measurement
- Glancing incident
- Synchrotron radiation
- Total reflection X-ray fluorescence analysis
- X-ray absorption near-edge structure spectroscopy
ASJC Scopus subject areas
- Analytical Chemistry