Synchrotron radiation-induced total reflection X-ray fluorescence analysis

F. Meirer, A. Singh, P. Pianetta, G. Pepponi, F. Meirer, C. Streli, Takayuki Homma

    Research output: Contribution to journalArticle

    33 Citations (Scopus)

    Abstract

    Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research.

    Original languageEnglish
    Pages (from-to)479-496
    Number of pages18
    JournalTrAC - Trends in Analytical Chemistry
    Volume29
    Issue number6
    DOIs
    Publication statusPublished - 2010 Jun

    Fingerprint

    Synchrotron radiation
    X-ray fluorescence
    Fluorescence
    X rays
    X ray absorption near edge structure spectroscopy
    XANES spectroscopy
    environmental research
    Industrial applications
    analytical method
    radiation
    analysis

    Keywords

    • Angle-dependent measurement
    • GI-XRF
    • Glancing incident
    • SR-TXRF
    • Synchrotron radiation
    • Total reflection X-ray fluorescence analysis
    • TXRF
    • TXRF-XANES
    • X-ray absorption near-edge structure spectroscopy

    ASJC Scopus subject areas

    • Analytical Chemistry
    • Spectroscopy
    • Environmental Chemistry

    Cite this

    Synchrotron radiation-induced total reflection X-ray fluorescence analysis. / Meirer, F.; Singh, A.; Pianetta, P.; Pepponi, G.; Meirer, F.; Streli, C.; Homma, Takayuki.

    In: TrAC - Trends in Analytical Chemistry, Vol. 29, No. 6, 06.2010, p. 479-496.

    Research output: Contribution to journalArticle

    Meirer, F. ; Singh, A. ; Pianetta, P. ; Pepponi, G. ; Meirer, F. ; Streli, C. ; Homma, Takayuki. / Synchrotron radiation-induced total reflection X-ray fluorescence analysis. In: TrAC - Trends in Analytical Chemistry. 2010 ; Vol. 29, No. 6. pp. 479-496.
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