TY - JOUR
T1 - Synchrotron radiation-induced total reflection X-ray fluorescence analysis
AU - Meirer, F.
AU - Singh, A.
AU - Pianetta, P.
AU - Pepponi, G.
AU - Meirer, F.
AU - Streli, C.
AU - Homma, T.
N1 - Copyright:
Copyright 2010 Elsevier B.V., All rights reserved.
PY - 2010/6
Y1 - 2010/6
N2 - Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research.
AB - Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research.
KW - Angle-dependent measurement
KW - GI-XRF
KW - Glancing incident
KW - SR-TXRF
KW - Synchrotron radiation
KW - TXRF
KW - TXRF-XANES
KW - Total reflection X-ray fluorescence analysis
KW - X-ray absorption near-edge structure spectroscopy
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U2 - 10.1016/j.trac.2010.04.001
DO - 10.1016/j.trac.2010.04.001
M3 - Review article
AN - SCOPUS:77953083406
VL - 29
SP - 479
EP - 496
JO - TrAC - Trends in Analytical Chemistry
JF - TrAC - Trends in Analytical Chemistry
SN - 0165-9936
IS - 6
ER -