Synchrotron radiation-induced total reflection X-ray fluorescence analysis

F. Meirer, A. Singh, P. Pianetta, G. Pepponi, F. Meirer, C. Streli, T. Homma

Research output: Contribution to journalReview article

34 Citations (Scopus)

Abstract

Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research.

Original languageEnglish
Pages (from-to)479-496
Number of pages18
JournalTrAC - Trends in Analytical Chemistry
Volume29
Issue number6
DOIs
Publication statusPublished - 2010 Jun 1

Keywords

  • Angle-dependent measurement
  • GI-XRF
  • Glancing incident
  • SR-TXRF
  • Synchrotron radiation
  • TXRF
  • TXRF-XANES
  • Total reflection X-ray fluorescence analysis
  • X-ray absorption near-edge structure spectroscopy

ASJC Scopus subject areas

  • Analytical Chemistry
  • Spectroscopy

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