Synthesis of per-fluorinated polymer-alloy based on PTFE by high temperature EB-irradiation

Akihiro Oshima, Fumihiro Mutou, Toshiyuki Hyuga, Saneto Asano, Shogo Ichizuri, Jingye Li, Takaharu Miura, Masakazu Washio

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    Abstract

    In this study, synthesis of per-fluorinated polymer-alloy based on polytetrafluoroethylene (PTFE) has been demonstrated by high temperature irradiation techniques. The per-fluorinated polymer-blend thin films originated from polymer dispersion (PTFE, PTFE/PFA polymer-blend: FA and PTFE/FEP polymer-blend: FE) have been fabricated by the wire-bar coating equipment. The obtained films (thickness: 5-15 μm) were irradiated by EB at 335 °C ± 5 °C in nitrogen gas atmosphere. Characterization of irradiated polymer-blends has been performed by 19F solid-state NMR spectroscopy, thermal analysis and so on. By DSC analysis, the heat of crystallization (ΔHc) of both irradiated polymer-blends were decreased with increase in absorbed dose. Moreover, the melting and crystallization temperatures of both materials shift to lower temperatures, compared with crosslinked PTFE. The obtained materials showed the lower crystallinity. By 19F solid-state NMR spectroscopy, the new signals appeared at around -160 ppm and at -188 ppm. The signals are assigned to the fluorine signals of CF groups, which represent crosslinking sites with Y-type (>CF-) and Y′-type (>CCF-) in the polymer-blend chains. Thus, it is confirmed that the polymer-alloys with good performance based on PTFE are synthesized through the radiation crosslinking reaction between PTFE and PFA or FEP molecules.

    Original languageEnglish
    Pages (from-to)172-178
    Number of pages7
    JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
    Volume236
    Issue number1-4
    DOIs
    Publication statusPublished - 2005 Jul

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    Keywords

    • F-NMR
    • DSC
    • EB
    • FEP
    • PFA
    • Polymer-alloy
    • PTFE

    ASJC Scopus subject areas

    • Surfaces, Coatings and Films
    • Instrumentation
    • Surfaces and Interfaces

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