Temperature effects in reverse-type avalanche photodiodes

Mitsuhiro Sato, Takayuki Yanagida, Akira Yoshikawa, Yoichi Yatsu, Jun Kataoka, Fumio Saito

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

These The present paper shows ionization coefficient ratios, k-values, k1 and keff, of reverse-type Si avalanche photodiode. Both of keff and k1, tend to increase when APDs are cooled down. The results for keff are 0.0023 ± 0.0002 at 20 °C, 0.0027 ± 0.0003 at 0 °C, and 0.0049 ±0.0007 at -20 °C. With the result of k1, temperature dependency of k-values Indicates mean free paths of the carriers for phonon scattering shows different temperature dependency, which is considered to reflect the inner structure of APDs.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposium Conference Record
Pages1491-1493
Number of pages3
Volume2
DOIs
Publication statusPublished - 2007
Externally publishedYes
Event2007 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS-MIC - Honolulu, HI
Duration: 2007 Oct 272007 Nov 3

Other

Other2007 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS-MIC
CityHonolulu, HI
Period07/10/2707/11/3

Fingerprint

Avalanche photodiodes
Thermal effects
Phonon scattering
Ionization
Temperature

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Industrial and Manufacturing Engineering

Cite this

Sato, M., Yanagida, T., Yoshikawa, A., Yatsu, Y., Kataoka, J., & Saito, F. (2007). Temperature effects in reverse-type avalanche photodiodes. In IEEE Nuclear Science Symposium Conference Record (Vol. 2, pp. 1491-1493). [4437281] https://doi.org/10.1109/NSSMIC.2007.4437281

Temperature effects in reverse-type avalanche photodiodes. / Sato, Mitsuhiro; Yanagida, Takayuki; Yoshikawa, Akira; Yatsu, Yoichi; Kataoka, Jun; Saito, Fumio.

IEEE Nuclear Science Symposium Conference Record. Vol. 2 2007. p. 1491-1493 4437281.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sato, M, Yanagida, T, Yoshikawa, A, Yatsu, Y, Kataoka, J & Saito, F 2007, Temperature effects in reverse-type avalanche photodiodes. in IEEE Nuclear Science Symposium Conference Record. vol. 2, 4437281, pp. 1491-1493, 2007 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS-MIC, Honolulu, HI, 07/10/27. https://doi.org/10.1109/NSSMIC.2007.4437281
Sato M, Yanagida T, Yoshikawa A, Yatsu Y, Kataoka J, Saito F. Temperature effects in reverse-type avalanche photodiodes. In IEEE Nuclear Science Symposium Conference Record. Vol. 2. 2007. p. 1491-1493. 4437281 https://doi.org/10.1109/NSSMIC.2007.4437281
Sato, Mitsuhiro ; Yanagida, Takayuki ; Yoshikawa, Akira ; Yatsu, Yoichi ; Kataoka, Jun ; Saito, Fumio. / Temperature effects in reverse-type avalanche photodiodes. IEEE Nuclear Science Symposium Conference Record. Vol. 2 2007. pp. 1491-1493
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