Terahertz spectroscopy as a new analyzing tool for dielectric properties of various insulating materials

Yoshimichi Ohki, M. Okada, N. Fuse, K. Iwai, M. Mizuno, K. Fukunaga

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    6 Citations (Scopus)

    Abstract

    Several examples of terahertz (THz) spectroscopic measurement results carried out for dielectric solids are reviewed, including THz time-domain spectra of polyamide-6 composites with nm-sized clay fillers obtained by the authors. For polyamide nanocomposites, it has become clear that the dielectric loss factor shows two peaks at around 1.9 THz and 2.7 to 3.1 THz. By referring to X-ray diffraction spectra, it is assumed that the origin of the former peak is the α-phase crystal in polyamide, and that the nanofiller loading suppresses α-phase crystallization. The latter peak shifts toward a lower frequency in the nanocomposites, which indicates that the presence of strong ionic bonds between the nanofiller and the polymer matrix restrains molecular motion and increases the relaxation time. This is believed to be the main reason of superior properties of the polymer nanocomposites.

    Original languageEnglish
    Title of host publicationAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
    Pages33-36
    Number of pages4
    DOIs
    Publication statusPublished - 2008
    Event2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2008 - Quebec City, QC
    Duration: 2008 Oct 262008 Oct 29

    Other

    Other2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2008
    CityQuebec City, QC
    Period08/10/2608/10/29

    Fingerprint

    Terahertz spectroscopy
    Insulating materials
    Polyamides
    Dielectric properties
    Nanocomposites
    Nylons
    Dielectric losses
    Crystallization
    Polymer matrix
    Relaxation time
    Fillers
    Polymers
    Clay
    X ray diffraction
    Crystals
    Composite materials

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

    Cite this

    Ohki, Y., Okada, M., Fuse, N., Iwai, K., Mizuno, M., & Fukunaga, K. (2008). Terahertz spectroscopy as a new analyzing tool for dielectric properties of various insulating materials. In Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP (pp. 33-36). [4772813] https://doi.org/10.1109/CEIDP.2008.4772813

    Terahertz spectroscopy as a new analyzing tool for dielectric properties of various insulating materials. / Ohki, Yoshimichi; Okada, M.; Fuse, N.; Iwai, K.; Mizuno, M.; Fukunaga, K.

    Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP. 2008. p. 33-36 4772813.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Ohki, Y, Okada, M, Fuse, N, Iwai, K, Mizuno, M & Fukunaga, K 2008, Terahertz spectroscopy as a new analyzing tool for dielectric properties of various insulating materials. in Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP., 4772813, pp. 33-36, 2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2008, Quebec City, QC, 08/10/26. https://doi.org/10.1109/CEIDP.2008.4772813
    Ohki Y, Okada M, Fuse N, Iwai K, Mizuno M, Fukunaga K. Terahertz spectroscopy as a new analyzing tool for dielectric properties of various insulating materials. In Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP. 2008. p. 33-36. 4772813 https://doi.org/10.1109/CEIDP.2008.4772813
    Ohki, Yoshimichi ; Okada, M. ; Fuse, N. ; Iwai, K. ; Mizuno, M. ; Fukunaga, K. / Terahertz spectroscopy as a new analyzing tool for dielectric properties of various insulating materials. Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP. 2008. pp. 33-36
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    abstract = "Several examples of terahertz (THz) spectroscopic measurement results carried out for dielectric solids are reviewed, including THz time-domain spectra of polyamide-6 composites with nm-sized clay fillers obtained by the authors. For polyamide nanocomposites, it has become clear that the dielectric loss factor shows two peaks at around 1.9 THz and 2.7 to 3.1 THz. By referring to X-ray diffraction spectra, it is assumed that the origin of the former peak is the α-phase crystal in polyamide, and that the nanofiller loading suppresses α-phase crystallization. The latter peak shifts toward a lower frequency in the nanocomposites, which indicates that the presence of strong ionic bonds between the nanofiller and the polymer matrix restrains molecular motion and increases the relaxation time. This is believed to be the main reason of superior properties of the polymer nanocomposites.",
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