Terahertz spectroscopy as a new analyzing tool for dielectric properties of various insulating materials

Y. Ohki, M. Okada, N. Fuse, K. Iwai, M. Mizuno, K. Fukunaga

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

Several examples of terahertz (THz) spectroscopic measurement results carried out for dielectric solids are reviewed, including THz time-domain spectra of polyamide-6 composites with nm-sized clay fillers obtained by the authors. For polyamide nanocomposites, it has become clear that the dielectric loss factor shows two peaks at around 1.9 THz and 2.7 to 3.1 THz. By referring to X-ray diffraction spectra, it is assumed that the origin of the former peak is the α-phase crystal in polyamide, and that the nanofiller loading suppresses α-phase crystallization. The latter peak shifts toward a lower frequency in the nanocomposites, which indicates that the presence of strong ionic bonds between the nanofiller and the polymer matrix restrains molecular motion and increases the relaxation time. This is believed to be the main reason of superior properties of the polymer nanocomposites.

Original languageEnglish
Title of host publication2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2008
Pages33-36
Number of pages4
DOIs
Publication statusPublished - 2008 Dec 1
Event2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2008 - Quebec City, QC, Canada
Duration: 2008 Oct 262008 Oct 29

Publication series

NameAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
ISSN (Print)0084-9162

Conference

Conference2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2008
CountryCanada
CityQuebec City, QC
Period08/10/2608/10/29

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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  • Cite this

    Ohki, Y., Okada, M., Fuse, N., Iwai, K., Mizuno, M., & Fukunaga, K. (2008). Terahertz spectroscopy as a new analyzing tool for dielectric properties of various insulating materials. In 2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2008 (pp. 33-36). [4772813] (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP). https://doi.org/10.1109/CEIDP.2008.4772813