TESEM: A tool for verifying security design pattern applications by model testing

Takanori Kobashi, Masatoshi Yoshizawa, Hironori Washizaki, Yoshiaki Fukazawa, Nobukazu Yoshioka, Takano Okubo, Haruhiko Kaiya

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)

    Abstract

    Because software developers are not necessarily security experts, identifying potential threats and vulnerabilities in the early stage of the development process (e.g., the requirement- or design-phase) is insufficient. Even if these issues are addressed at an early stage, it does not guarantee that the final software product actually satisfies security requirements. To realize secure designs, we propose extended security patterns, which include requirement-and design-level patterns as well as a new model testing process. Our approach is implemented in a tool called TESEM (Test Driven Secure Modeling Tool), which supports pattern applications by creating a script to execute model testing automatically. During an early development stage, the developer specifies threats and vulnerabilities in the target system, and then TESEM verifies whether the security patterns are properly applied and assesses whether these vulnerabilities are resolved.

    Original languageEnglish
    Title of host publication2015 IEEE 8th International Conference on Software Testing, Verification and Validation, ICST 2015 - Proceedings
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Print)9781479971251
    DOIs
    Publication statusPublished - 2015 May 5
    Event8th IEEE International Conference on Software Testing, Verification and Validation, ICST 2015 - Graz, Austria
    Duration: 2015 Apr 132015 Apr 17

    Other

    Other8th IEEE International Conference on Software Testing, Verification and Validation, ICST 2015
    CountryAustria
    CityGraz
    Period15/4/1315/4/17

    Fingerprint

    Testing

    Keywords

    • Component
    • Model Testing
    • Security Patterns
    • Test-Driven Development
    • UML

    ASJC Scopus subject areas

    • Software

    Cite this

    Kobashi, T., Yoshizawa, M., Washizaki, H., Fukazawa, Y., Yoshioka, N., Okubo, T., & Kaiya, H. (2015). TESEM: A tool for verifying security design pattern applications by model testing. In 2015 IEEE 8th International Conference on Software Testing, Verification and Validation, ICST 2015 - Proceedings [7102633] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICST.2015.7102633

    TESEM : A tool for verifying security design pattern applications by model testing. / Kobashi, Takanori; Yoshizawa, Masatoshi; Washizaki, Hironori; Fukazawa, Yoshiaki; Yoshioka, Nobukazu; Okubo, Takano; Kaiya, Haruhiko.

    2015 IEEE 8th International Conference on Software Testing, Verification and Validation, ICST 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2015. 7102633.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Kobashi, T, Yoshizawa, M, Washizaki, H, Fukazawa, Y, Yoshioka, N, Okubo, T & Kaiya, H 2015, TESEM: A tool for verifying security design pattern applications by model testing. in 2015 IEEE 8th International Conference on Software Testing, Verification and Validation, ICST 2015 - Proceedings., 7102633, Institute of Electrical and Electronics Engineers Inc., 8th IEEE International Conference on Software Testing, Verification and Validation, ICST 2015, Graz, Austria, 15/4/13. https://doi.org/10.1109/ICST.2015.7102633
    Kobashi T, Yoshizawa M, Washizaki H, Fukazawa Y, Yoshioka N, Okubo T et al. TESEM: A tool for verifying security design pattern applications by model testing. In 2015 IEEE 8th International Conference on Software Testing, Verification and Validation, ICST 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2015. 7102633 https://doi.org/10.1109/ICST.2015.7102633
    Kobashi, Takanori ; Yoshizawa, Masatoshi ; Washizaki, Hironori ; Fukazawa, Yoshiaki ; Yoshioka, Nobukazu ; Okubo, Takano ; Kaiya, Haruhiko. / TESEM : A tool for verifying security design pattern applications by model testing. 2015 IEEE 8th International Conference on Software Testing, Verification and Validation, ICST 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2015.
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