Abstract
As well-known, the human single eye has a horizontally approximately 120-degree wide FOV. Its FOV is wide, but only its central FOV has high visual acuity. Visual acuity in its peripheral FOV is very low. By changing its view line into a target, the human can observe it in detail by its central FOV and simultaneously can observe the whole of environment by its wide FOV. This means that the human eye performs a smart data acquisition, i.e., getting more detailed visual information with smaller data amount from environment by combining appropriate eye movements. WAFVS was investigated taking into account the above human eye's functionality. The most characterized point of WAFVS is of the resolution-variant input image data, i.e., this vision sensor gets a wide-angle image where spatial resolution is not uniform like the human visual acuity. Therefore, WAFVS can reduce image data hugely. This is a strong advantage when image data are transmitted and recorded in a storage device when the vision sensor is applied for remote operation. In this paper, a remapping method for WAFVS is proposed and implemented, i.e., tessellation for Wide Angle Foveated image with 4 regions based on overlapping circular RF mapping.
Original language | English |
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Title of host publication | Proceedings of the IECON 2016 - 42nd Annual Conference of the Industrial Electronics Society |
Publisher | IEEE Computer Society |
Pages | 6187-6192 |
Number of pages | 6 |
ISBN (Electronic) | 9781509034741 |
DOIs | |
Publication status | Published - 2016 Dec 21 |
Event | 42nd Conference of the Industrial Electronics Society, IECON 2016 - Florence, Italy Duration: 2016 Oct 24 → 2016 Oct 27 |
Other
Other | 42nd Conference of the Industrial Electronics Society, IECON 2016 |
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Country/Territory | Italy |
City | Florence |
Period | 16/10/24 → 16/10/27 |
Keywords
- Multi-purpose use
- Overlapping circular RF mapping
- Space-variant resolution
- Tessellation
- Wide-angle fovea vision sensor
- Wide-Angle Foveated image model with 4 regions
ASJC Scopus subject areas
- Control and Systems Engineering
- Electrical and Electronic Engineering