Test case reduction based on the join condition in pairwise coverage-based database testing

Yuper Lay Myint; Hironori Washizaki; Yoshiaki Fukazawa; Hideyuki Kanuka; Hiroki Ohbayashi

doi:10.1109/ICSTW.2018.00055

Test case reduction based on the join condition in pairwise coverage-based database testing

Yuper Lay Myint, Hironori Washizaki, Yoshiaki Fukazawa, Hideyuki Kanuka, Hiroki Ohbayashi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Testing database applications correctly and effectively remains an issue. This study improves Selected Pairwise Coverage Testing (SPCT), which is a pairwise coverage-based test method for database applications that can discover bugs not detected by conventional methods. Because SPCT considers only selected columns in the SQL query and the conditions in the simple WHERE clause, achieving full pairwise coverage has some redundancies. In this work, we propose a new pairwise coverage-based test method, Join-based Pairwise Coverage Testing (JPCT) by considering the condition in the JOIN clause to further reduce the redundant parameter combinations. The experimental results are evaluated to con?rm the effectiveness of the proposed method, JPCT compared to SPCT.

Original language	English
Title of host publication	Proceedings - 2018 IEEE 11th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	239-243
Number of pages	5
ISBN (Electronic)	9781538663523
DOIs	https://doi.org/10.1109/ICSTW.2018.00055
Publication status	Published - 2018 Jul 16
Event	11th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018 - Vasteras, Sweden Duration: 2018 Apr 9 → 2018 Apr 13

Other

Other	11th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018
Country/Territory	Sweden
City	Vasteras
Period	18/4/9 → 18/4/13

Keywords

Database testing
Pairwise coverage

ASJC Scopus subject areas

Software
Safety, Risk, Reliability and Quality

Access to Document

10.1109/ICSTW.2018.00055

Cite this

Lay Myint, Y., Washizaki, H., Fukazawa, Y., Kanuka, H., & Ohbayashi, H. (2018). Test case reduction based on the join condition in pairwise coverage-based database testing. In Proceedings - 2018 IEEE 11th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018 (pp. 239-243). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICSTW.2018.00055

Test case reduction based on the join condition in pairwise coverage-based database testing. / Lay Myint, Yuper; Washizaki, Hironori ; Fukazawa, Yoshiaki; Kanuka, Hideyuki; Ohbayashi, Hiroki.

Proceedings - 2018 IEEE 11th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018. Institute of Electrical and Electronics Engineers Inc., 2018. p. 239-243.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Lay Myint, Y, Washizaki, H , Fukazawa, Y, Kanuka, H & Ohbayashi, H 2018, Test case reduction based on the join condition in pairwise coverage-based database testing. in Proceedings - 2018 IEEE 11th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018. Institute of Electrical and Electronics Engineers Inc., pp. 239-243, 11th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018, Vasteras, Sweden, 18/4/9. https://doi.org/10.1109/ICSTW.2018.00055

Lay Myint Y, Washizaki H , Fukazawa Y, Kanuka H, Ohbayashi H. Test case reduction based on the join condition in pairwise coverage-based database testing. In Proceedings - 2018 IEEE 11th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018. Institute of Electrical and Electronics Engineers Inc. 2018. p. 239-243 https://doi.org/10.1109/ICSTW.2018.00055

Lay Myint, Yuper ; Washizaki, Hironori ; Fukazawa, Yoshiaki ; Kanuka, Hideyuki ; Ohbayashi, Hiroki. / Test case reduction based on the join condition in pairwise coverage-based database testing. Proceedings - 2018 IEEE 11th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 239-243

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Test case reduction based on the join condition in pairwise coverage-based database testing

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Keywords

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