Abstract
Testing database applications correctly and effectively remains an issue. This study improves Selected Pairwise Coverage Testing (SPCT), which is a pairwise coverage-based test method for database applications that can discover bugs not detected by conventional methods. Because SPCT considers only selected columns in the SQL query and the conditions in the simple WHERE clause, achieving full pairwise coverage has some redundancies. In this work, we propose a new pairwise coverage-based test method, Join-based Pairwise Coverage Testing (JPCT) by considering the condition in the JOIN clause to further reduce the redundant parameter combinations. The experimental results are evaluated to con?rm the effectiveness of the proposed method, JPCT compared to SPCT.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - 2018 IEEE 11th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 239-243 |
| Number of pages | 5 |
| ISBN (Electronic) | 9781538663523 |
| DOIs | |
| Publication status | Published - 2018 Jul 16 |
| Event | 11th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018 - Vasteras, Sweden Duration: 2018 Apr 9 → 2018 Apr 13 |
Other
| Other | 11th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018 |
|---|---|
| Country | Sweden |
| City | Vasteras |
| Period | 18/4/9 → 18/4/13 |
Fingerprint
Keywords
- Database testing
- Pairwise coverage
ASJC Scopus subject areas
- Software
- Safety, Risk, Reliability and Quality
Cite this
Test case reduction based on the join condition in pairwise coverage-based database testing. / Lay Myint, Yuper; Washizaki, Hironori; Fukazawa, Yoshiaki; Kanuka, Hideyuki; Ohbayashi, Hiroki.
Proceedings - 2018 IEEE 11th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018. Institute of Electrical and Electronics Engineers Inc., 2018. p. 239-243.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Test case reduction based on the join condition in pairwise coverage-based database testing
AU - Lay Myint, Yuper
AU - Washizaki, Hironori
AU - Fukazawa, Yoshiaki
AU - Kanuka, Hideyuki
AU - Ohbayashi, Hiroki
PY - 2018/7/16
Y1 - 2018/7/16
N2 - Testing database applications correctly and effectively remains an issue. This study improves Selected Pairwise Coverage Testing (SPCT), which is a pairwise coverage-based test method for database applications that can discover bugs not detected by conventional methods. Because SPCT considers only selected columns in the SQL query and the conditions in the simple WHERE clause, achieving full pairwise coverage has some redundancies. In this work, we propose a new pairwise coverage-based test method, Join-based Pairwise Coverage Testing (JPCT) by considering the condition in the JOIN clause to further reduce the redundant parameter combinations. The experimental results are evaluated to con?rm the effectiveness of the proposed method, JPCT compared to SPCT.
AB - Testing database applications correctly and effectively remains an issue. This study improves Selected Pairwise Coverage Testing (SPCT), which is a pairwise coverage-based test method for database applications that can discover bugs not detected by conventional methods. Because SPCT considers only selected columns in the SQL query and the conditions in the simple WHERE clause, achieving full pairwise coverage has some redundancies. In this work, we propose a new pairwise coverage-based test method, Join-based Pairwise Coverage Testing (JPCT) by considering the condition in the JOIN clause to further reduce the redundant parameter combinations. The experimental results are evaluated to con?rm the effectiveness of the proposed method, JPCT compared to SPCT.
KW - Database testing
KW - Pairwise coverage
UR - http://www.scopus.com/inward/record.url?scp=85050965941&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85050965941&partnerID=8YFLogxK
U2 - 10.1109/ICSTW.2018.00055
DO - 10.1109/ICSTW.2018.00055
M3 - Conference contribution
AN - SCOPUS:85050965941
SP - 239
EP - 243
BT - Proceedings - 2018 IEEE 11th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018
PB - Institute of Electrical and Electronics Engineers Inc.
ER -