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Test data compression for scan-based BIST aiming at 100x compression rate
Masayuki Arai*, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
3
Citations
(Scopus)