Test data compression of 100x for scan-based BIST

Masayuki Arai*, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

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Mathematics

Engineering & Materials Science