Test generation and diagnostic test generation for open faults with considering adjacent lines

Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Koji Yamazaki, Toshiyuki Tsutsumi, Hiroyuki Yotsuyanagi, Masaki Hashizume

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

In order to ensure high quality of DSM circuits, testing for the open defect in the circuits is necessary. However, the modeling and techniques for test generation for open faults have not been established yet. In this paper, we propose a method for generating tests and diagnostic tests based on a new open fault model. Firstly, we show a new open fault model with considering adjacent lines [9]. Under the open fault model, we reveal more about the conditions to excite the open fault. Next we propose a method for generating tests for open faults by using a stuck-at fault test with don't cares. We also propose a method for generating a diagnostic test that can distinguish the pair of open faults. Finally, experimental results show that 1) the proposed method is able to achieve 100% fault coverages for almost all benchmark circuits and 2) the proposed method is able to reduce the number of indistinguished open fault pairs.

Original languageEnglish
Title of host publicationProceedings - 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007
Pages243-251
Number of pages9
DOIs
Publication statusPublished - 2007
Externally publishedYes
Event22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007 - Rome, Italy
Duration: 2007 Sep 262007 Sep 28

Publication series

NameProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
ISSN (Print)1550-5774

Conference

Conference22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007
Country/TerritoryItaly
CityRome
Period07/9/2607/9/28

ASJC Scopus subject areas

  • Engineering(all)

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