Test generation and diagnostic test generation for open faults with considering adjacent lines

Hiroshi Takahashi; Yoshinobu Higami; Toru Kikkawa; Takashi Aikyo; Yuzo Takamatsu; Koji Yamazaki; Toshiyuki Tsutsumi; Hiroyuki Yotsuyanagi; Masaki Hashizume

doi:10.1109/DFT.2007.11

Test generation and diagnostic test generation for open faults with considering adjacent lines

Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Koji Yamazaki, Toshiyuki Tsutsumi, Hiroyuki Yotsuyanagi, Masaki Hashizume

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

7 Citations (Scopus)

Abstract

In order to ensure high quality of DSM circuits, testing for the open defect in the circuits is necessary. However, the modeling and techniques for test generation for open faults have not been established yet. In this paper, we propose a method for generating tests and diagnostic tests based on a new open fault model. Firstly, we show a new open fault model with considering adjacent lines [9]. Under the open fault model, we reveal more about the conditions to excite the open fault. Next we propose a method for generating tests for open faults by using a stuck-at fault test with don't cares. We also propose a method for generating a diagnostic test that can distinguish the pair of open faults. Finally, experimental results show that 1) the proposed method is able to achieve 100% fault coverages for almost all benchmark circuits and 2) the proposed method is able to reduce the number of indistinguished open fault pairs.

Original language	English
Title of host publication	Proceedings - 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007
Pages	243-251
Number of pages	9
DOIs	https://doi.org/10.1109/DFT.2007.11
Publication status	Published - 2007
Externally published	Yes
Event	22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007 - Rome, Italy Duration: 2007 Sept 26 → 2007 Sept 28

Publication series

Name	Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
ISSN (Print)	1550-5774

Conference

Conference	22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007
Country/Territory	Italy
City	Rome
Period	07/9/26 → 07/9/28

ASJC Scopus subject areas

Engineering(all)

Access to Document

10.1109/DFT.2007.11

Cite this

Takahashi, H., Higami, Y., Kikkawa, T., Aikyo, T., Takamatsu, Y., Yamazaki, K., Tsutsumi, T., Yotsuyanagi, H., & Hashizume, M. (2007). Test generation and diagnostic test generation for open faults with considering adjacent lines. In Proceedings - 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007 (pp. 243-251). [4358393] (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems). https://doi.org/10.1109/DFT.2007.11

Test generation and diagnostic test generation for open faults with considering adjacent lines. / Takahashi, Hiroshi; Higami, Yoshinobu; Kikkawa, Toru et al.

Proceedings - 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007. 2007. p. 243-251 4358393 (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Takahashi, H, Higami, Y, Kikkawa, T, Aikyo, T, Takamatsu, Y, Yamazaki, K, Tsutsumi, T, Yotsuyanagi, H & Hashizume, M 2007, Test generation and diagnostic test generation for open faults with considering adjacent lines. in Proceedings - 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007., 4358393, Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 243-251, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007, Rome, Italy, 07/9/26. https://doi.org/10.1109/DFT.2007.11

Takahashi H, Higami Y, Kikkawa T, Aikyo T, Takamatsu Y, Yamazaki K et al. Test generation and diagnostic test generation for open faults with considering adjacent lines. In Proceedings - 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007. 2007. p. 243-251. 4358393. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems). doi: 10.1109/DFT.2007.11

Takahashi, Hiroshi ; Higami, Yoshinobu ; Kikkawa, Toru et al. / Test generation and diagnostic test generation for open faults with considering adjacent lines. Proceedings - 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007. 2007. pp. 243-251 (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems).

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abstract = "In order to ensure high quality of DSM circuits, testing for the open defect in the circuits is necessary. However, the modeling and techniques for test generation for open faults have not been established yet. In this paper, we propose a method for generating tests and diagnostic tests based on a new open fault model. Firstly, we show a new open fault model with considering adjacent lines [9]. Under the open fault model, we reveal more about the conditions to excite the open fault. Next we propose a method for generating tests for open faults by using a stuck-at fault test with don't cares. We also propose a method for generating a diagnostic test that can distinguish the pair of open faults. Finally, experimental results show that 1) the proposed method is able to achieve 100% fault coverages for almost all benchmark circuits and 2) the proposed method is able to reduce the number of indistinguished open fault pairs.",

author = "Hiroshi Takahashi and Yoshinobu Higami and Toru Kikkawa and Takashi Aikyo and Yuzo Takamatsu and Koji Yamazaki and Toshiyuki Tsutsumi and Hiroyuki Yotsuyanagi and Masaki Hashizume",

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note = "22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007 ; Conference date: 26-09-2007 Through 28-09-2007",

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AU - Takahashi, Hiroshi

AU - Higami, Yoshinobu

AU - Kikkawa, Toru

AU - Aikyo, Takashi

AU - Takamatsu, Yuzo

AU - Yamazaki, Koji

AU - Tsutsumi, Toshiyuki

AU - Yotsuyanagi, Hiroyuki

AU - Hashizume, Masaki

PY - 2007

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N2 - In order to ensure high quality of DSM circuits, testing for the open defect in the circuits is necessary. However, the modeling and techniques for test generation for open faults have not been established yet. In this paper, we propose a method for generating tests and diagnostic tests based on a new open fault model. Firstly, we show a new open fault model with considering adjacent lines [9]. Under the open fault model, we reveal more about the conditions to excite the open fault. Next we propose a method for generating tests for open faults by using a stuck-at fault test with don't cares. We also propose a method for generating a diagnostic test that can distinguish the pair of open faults. Finally, experimental results show that 1) the proposed method is able to achieve 100% fault coverages for almost all benchmark circuits and 2) the proposed method is able to reduce the number of indistinguished open fault pairs.

AB - In order to ensure high quality of DSM circuits, testing for the open defect in the circuits is necessary. However, the modeling and techniques for test generation for open faults have not been established yet. In this paper, we propose a method for generating tests and diagnostic tests based on a new open fault model. Firstly, we show a new open fault model with considering adjacent lines [9]. Under the open fault model, we reveal more about the conditions to excite the open fault. Next we propose a method for generating tests for open faults by using a stuck-at fault test with don't cares. We also propose a method for generating a diagnostic test that can distinguish the pair of open faults. Finally, experimental results show that 1) the proposed method is able to achieve 100% fault coverages for almost all benchmark circuits and 2) the proposed method is able to reduce the number of indistinguished open fault pairs.

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ER -

Test generation and diagnostic test generation for open faults with considering adjacent lines

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