The platinum/titanium-nitride interface: X-ray photoelectron spectroscopy studies

Nikola Mati; Gary S. Chottiner; Frank Ernst; Daniel Alberto Scherson

doi:10.1149/2.012206esl

The platinum/titanium-nitride interface: X-ray photoelectron spectroscopy studies

Nikola Mati^*, Gary S. Chottiner, Frank Ernst, Daniel Alberto Scherson

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

The nature of the interactions between Pt and TiN, a material of interest as a support for proton-exchange-membrane (PEM) fuel cell applications, have been examined in ultrahigh vacuum (UHV) using X-ray photoelectron spectroscopy (XPS). For small amounts of Pt, a reaction takes place yielding XPS features consistent with formation of the intermetallic compound PtTi. Increasing the amount of Pt shifts the 4f ₇₂ electron binding energy toward that of metallic Pt. Complementary angle-resolved XPS revealed that Pt remains in the outer surface region of the resulting multicomponent film. The results show that TiN layers with a thickness of only ca. 1 nm already form an effective barrier to Pt diffusion at room temperature.

Original language	English
Journal	Electrochemical and Solid-State Letters
Volume	15
Issue number	6
DOIs	https://doi.org/10.1149/2.012206esl
Publication status	Published - 2012 May 7
Externally published	Yes

ASJC Scopus subject areas

Electrochemistry
Electrical and Electronic Engineering
Materials Science(all)
Chemical Engineering(all)
Physical and Theoretical Chemistry

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title = "The platinum/titanium-nitride interface: X-ray photoelectron spectroscopy studies",

abstract = "The nature of the interactions between Pt and TiN, a material of interest as a support for proton-exchange-membrane (PEM) fuel cell applications, have been examined in ultrahigh vacuum (UHV) using X-ray photoelectron spectroscopy (XPS). For small amounts of Pt, a reaction takes place yielding XPS features consistent with formation of the intermetallic compound PtTi. Increasing the amount of Pt shifts the 4f 72 electron binding energy toward that of metallic Pt. Complementary angle-resolved XPS revealed that Pt remains in the outer surface region of the resulting multicomponent film. The results show that TiN layers with a thickness of only ca. 1 nm already form an effective barrier to Pt diffusion at room temperature.",

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doi = "10.1149/2.012206esl",

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T1 - The platinum/titanium-nitride interface

T2 - X-ray photoelectron spectroscopy studies

AU - Mati, Nikola

AU - Chottiner, Gary S.

AU - Ernst, Frank

AU - Scherson, Daniel Alberto

PY - 2012/5/7

Y1 - 2012/5/7

N2 - The nature of the interactions between Pt and TiN, a material of interest as a support for proton-exchange-membrane (PEM) fuel cell applications, have been examined in ultrahigh vacuum (UHV) using X-ray photoelectron spectroscopy (XPS). For small amounts of Pt, a reaction takes place yielding XPS features consistent with formation of the intermetallic compound PtTi. Increasing the amount of Pt shifts the 4f 72 electron binding energy toward that of metallic Pt. Complementary angle-resolved XPS revealed that Pt remains in the outer surface region of the resulting multicomponent film. The results show that TiN layers with a thickness of only ca. 1 nm already form an effective barrier to Pt diffusion at room temperature.

AB - The nature of the interactions between Pt and TiN, a material of interest as a support for proton-exchange-membrane (PEM) fuel cell applications, have been examined in ultrahigh vacuum (UHV) using X-ray photoelectron spectroscopy (XPS). For small amounts of Pt, a reaction takes place yielding XPS features consistent with formation of the intermetallic compound PtTi. Increasing the amount of Pt shifts the 4f 72 electron binding energy toward that of metallic Pt. Complementary angle-resolved XPS revealed that Pt remains in the outer surface region of the resulting multicomponent film. The results show that TiN layers with a thickness of only ca. 1 nm already form an effective barrier to Pt diffusion at room temperature.

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The platinum/titanium-nitride interface: X-ray photoelectron spectroscopy studies

Abstract

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