The Si/CdTe semiconductor camera of the ASTRO-H Hard X-ray Imager (HXI)

Goro Sato, Kouichi Hagino, Shin Watanabe, Kei Genba, Atsushi Harayama, Hironori Kanematsu, Jun Kataoka, Miho Katsuragawa, Madoka Kawaharada, Shogo Kobayashi, Motohide Kokubun, Yoshikatsu Kuroda, Kazuo Makishima, Kazunori Masukawa, Taketo Mimura, Katsuma Miyake, Hiroaki Murakami, Toshio Nakano, Kazuhiro Nakazawa, Hirofumi NodaHirokazu Odaka, Mitsunobu Onishi, Shinya Saito, Rie Sato, Tamotsu Sato, Hiroyasu Tajima, Hiromitsu Takahashi, Tadayuki Takahashi, Shin'ichiro Takeda, Takayuki Yuasa

    Research output: Contribution to journalArticle

    15 Citations (Scopus)

    Abstract

    The Hard X-ray Imager (HXI) is one of the instruments onboard the ASTRO-H mission [1-4] to be launched in early 2016. The HXI is the focal plane detector of the hard X-ray reflecting telescope that covers an energy range from 5 to 80. keV. It will execute observations of astronomical objects with a sensitivity for point sources as faint as 1/100,000 of the Crab nebula at >10keV. The HXI camera - the imaging part of the HXI - is realized by a hybrid semiconductor detector system that consists of silicon (Si) and cadmium telluride (CdTe) semiconductor detectors. Here, we present the final design of the HXI camera and report on the development of the flight model. The camera is composed of four layers of Double-sided Silicon Strip Detectors (DSSDs) and one layer of CdTe Double-sided Strip Detector (CdTe-DSD), each with an imaging area of 32. mm×32. mm. The strip pitch of the Si and CdTe sensors is 250. μm, and the signals from all 1280 strips are processed by 40 Application Specified Integrated Circuits (ASICs) developed for the HXI. The five layers of sensors are vertically stacked with a 4. mm spacing to increase the detection efficiency. The thickness of the sensors is 0.5. mm for the Si, and 0.75. mm for the CdTe. In this configuration, soft X-ray photons will be absorbed in the Si part, while hard X-ray photons will go through the Si part and will be detected in the CdTe part. The design of the sensor trays, peripheral circuits, power connections, and readout schemes are also described. The flight models of the HXI camera have been manufactured, tested and installed in the HXI instrument and then on the satellite.

    Fingerprint

    Cadmium telluride
    cadmium tellurides
    Image sensors
    Cameras
    cameras
    Semiconductor materials
    X rays
    Silicon
    silicon
    x rays
    strip
    detectors
    Semiconductor detectors
    sensors
    Sensors
    Detectors
    reflecting telescopes
    Photons
    flight
    trays

    Keywords

    • ASTRO-H HXI
    • CdTe
    • Hard X-ray detector
    • Semiconductor detector
    • Silicon
    • Strip detector

    ASJC Scopus subject areas

    • Instrumentation
    • Nuclear and High Energy Physics

    Cite this

    The Si/CdTe semiconductor camera of the ASTRO-H Hard X-ray Imager (HXI). / Sato, Goro; Hagino, Kouichi; Watanabe, Shin; Genba, Kei; Harayama, Atsushi; Kanematsu, Hironori; Kataoka, Jun; Katsuragawa, Miho; Kawaharada, Madoka; Kobayashi, Shogo; Kokubun, Motohide; Kuroda, Yoshikatsu; Makishima, Kazuo; Masukawa, Kazunori; Mimura, Taketo; Miyake, Katsuma; Murakami, Hiroaki; Nakano, Toshio; Nakazawa, Kazuhiro; Noda, Hirofumi; Odaka, Hirokazu; Onishi, Mitsunobu; Saito, Shinya; Sato, Rie; Sato, Tamotsu; Tajima, Hiroyasu; Takahashi, Hiromitsu; Takahashi, Tadayuki; Takeda, Shin'ichiro; Yuasa, Takayuki.

    In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 04.12.2015.

    Research output: Contribution to journalArticle

    Sato, G, Hagino, K, Watanabe, S, Genba, K, Harayama, A, Kanematsu, H, Kataoka, J, Katsuragawa, M, Kawaharada, M, Kobayashi, S, Kokubun, M, Kuroda, Y, Makishima, K, Masukawa, K, Mimura, T, Miyake, K, Murakami, H, Nakano, T, Nakazawa, K, Noda, H, Odaka, H, Onishi, M, Saito, S, Sato, R, Sato, T, Tajima, H, Takahashi, H, Takahashi, T, Takeda, S & Yuasa, T 2015, 'The Si/CdTe semiconductor camera of the ASTRO-H Hard X-ray Imager (HXI)', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. https://doi.org/10.1016/j.nima.2016.03.038
    Sato, Goro ; Hagino, Kouichi ; Watanabe, Shin ; Genba, Kei ; Harayama, Atsushi ; Kanematsu, Hironori ; Kataoka, Jun ; Katsuragawa, Miho ; Kawaharada, Madoka ; Kobayashi, Shogo ; Kokubun, Motohide ; Kuroda, Yoshikatsu ; Makishima, Kazuo ; Masukawa, Kazunori ; Mimura, Taketo ; Miyake, Katsuma ; Murakami, Hiroaki ; Nakano, Toshio ; Nakazawa, Kazuhiro ; Noda, Hirofumi ; Odaka, Hirokazu ; Onishi, Mitsunobu ; Saito, Shinya ; Sato, Rie ; Sato, Tamotsu ; Tajima, Hiroyasu ; Takahashi, Hiromitsu ; Takahashi, Tadayuki ; Takeda, Shin'ichiro ; Yuasa, Takayuki. / The Si/CdTe semiconductor camera of the ASTRO-H Hard X-ray Imager (HXI). In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2015.
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    abstract = "The Hard X-ray Imager (HXI) is one of the instruments onboard the ASTRO-H mission [1-4] to be launched in early 2016. The HXI is the focal plane detector of the hard X-ray reflecting telescope that covers an energy range from 5 to 80. keV. It will execute observations of astronomical objects with a sensitivity for point sources as faint as 1/100,000 of the Crab nebula at >10keV. The HXI camera - the imaging part of the HXI - is realized by a hybrid semiconductor detector system that consists of silicon (Si) and cadmium telluride (CdTe) semiconductor detectors. Here, we present the final design of the HXI camera and report on the development of the flight model. The camera is composed of four layers of Double-sided Silicon Strip Detectors (DSSDs) and one layer of CdTe Double-sided Strip Detector (CdTe-DSD), each with an imaging area of 32. mm×32. mm. The strip pitch of the Si and CdTe sensors is 250. μm, and the signals from all 1280 strips are processed by 40 Application Specified Integrated Circuits (ASICs) developed for the HXI. The five layers of sensors are vertically stacked with a 4. mm spacing to increase the detection efficiency. The thickness of the sensors is 0.5. mm for the Si, and 0.75. mm for the CdTe. In this configuration, soft X-ray photons will be absorbed in the Si part, while hard X-ray photons will go through the Si part and will be detected in the CdTe part. The design of the sensor trays, peripheral circuits, power connections, and readout schemes are also described. The flight models of the HXI camera have been manufactured, tested and installed in the HXI instrument and then on the satellite.",
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    author = "Goro Sato and Kouichi Hagino and Shin Watanabe and Kei Genba and Atsushi Harayama and Hironori Kanematsu and Jun Kataoka and Miho Katsuragawa and Madoka Kawaharada and Shogo Kobayashi and Motohide Kokubun and Yoshikatsu Kuroda and Kazuo Makishima and Kazunori Masukawa and Taketo Mimura and Katsuma Miyake and Hiroaki Murakami and Toshio Nakano and Kazuhiro Nakazawa and Hirofumi Noda and Hirokazu Odaka and Mitsunobu Onishi and Shinya Saito and Rie Sato and Tamotsu Sato and Hiroyasu Tajima and Hiromitsu Takahashi and Tadayuki Takahashi and Shin'ichiro Takeda and Takayuki Yuasa",
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    T1 - The Si/CdTe semiconductor camera of the ASTRO-H Hard X-ray Imager (HXI)

    AU - Sato, Goro

    AU - Hagino, Kouichi

    AU - Watanabe, Shin

    AU - Genba, Kei

    AU - Harayama, Atsushi

    AU - Kanematsu, Hironori

    AU - Kataoka, Jun

    AU - Katsuragawa, Miho

    AU - Kawaharada, Madoka

    AU - Kobayashi, Shogo

    AU - Kokubun, Motohide

    AU - Kuroda, Yoshikatsu

    AU - Makishima, Kazuo

    AU - Masukawa, Kazunori

    AU - Mimura, Taketo

    AU - Miyake, Katsuma

    AU - Murakami, Hiroaki

    AU - Nakano, Toshio

    AU - Nakazawa, Kazuhiro

    AU - Noda, Hirofumi

    AU - Odaka, Hirokazu

    AU - Onishi, Mitsunobu

    AU - Saito, Shinya

    AU - Sato, Rie

    AU - Sato, Tamotsu

    AU - Tajima, Hiroyasu

    AU - Takahashi, Hiromitsu

    AU - Takahashi, Tadayuki

    AU - Takeda, Shin'ichiro

    AU - Yuasa, Takayuki

    PY - 2015/12/4

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    N2 - The Hard X-ray Imager (HXI) is one of the instruments onboard the ASTRO-H mission [1-4] to be launched in early 2016. The HXI is the focal plane detector of the hard X-ray reflecting telescope that covers an energy range from 5 to 80. keV. It will execute observations of astronomical objects with a sensitivity for point sources as faint as 1/100,000 of the Crab nebula at >10keV. The HXI camera - the imaging part of the HXI - is realized by a hybrid semiconductor detector system that consists of silicon (Si) and cadmium telluride (CdTe) semiconductor detectors. Here, we present the final design of the HXI camera and report on the development of the flight model. The camera is composed of four layers of Double-sided Silicon Strip Detectors (DSSDs) and one layer of CdTe Double-sided Strip Detector (CdTe-DSD), each with an imaging area of 32. mm×32. mm. The strip pitch of the Si and CdTe sensors is 250. μm, and the signals from all 1280 strips are processed by 40 Application Specified Integrated Circuits (ASICs) developed for the HXI. The five layers of sensors are vertically stacked with a 4. mm spacing to increase the detection efficiency. The thickness of the sensors is 0.5. mm for the Si, and 0.75. mm for the CdTe. In this configuration, soft X-ray photons will be absorbed in the Si part, while hard X-ray photons will go through the Si part and will be detected in the CdTe part. The design of the sensor trays, peripheral circuits, power connections, and readout schemes are also described. The flight models of the HXI camera have been manufactured, tested and installed in the HXI instrument and then on the satellite.

    AB - The Hard X-ray Imager (HXI) is one of the instruments onboard the ASTRO-H mission [1-4] to be launched in early 2016. The HXI is the focal plane detector of the hard X-ray reflecting telescope that covers an energy range from 5 to 80. keV. It will execute observations of astronomical objects with a sensitivity for point sources as faint as 1/100,000 of the Crab nebula at >10keV. The HXI camera - the imaging part of the HXI - is realized by a hybrid semiconductor detector system that consists of silicon (Si) and cadmium telluride (CdTe) semiconductor detectors. Here, we present the final design of the HXI camera and report on the development of the flight model. The camera is composed of four layers of Double-sided Silicon Strip Detectors (DSSDs) and one layer of CdTe Double-sided Strip Detector (CdTe-DSD), each with an imaging area of 32. mm×32. mm. The strip pitch of the Si and CdTe sensors is 250. μm, and the signals from all 1280 strips are processed by 40 Application Specified Integrated Circuits (ASICs) developed for the HXI. The five layers of sensors are vertically stacked with a 4. mm spacing to increase the detection efficiency. The thickness of the sensors is 0.5. mm for the Si, and 0.75. mm for the CdTe. In this configuration, soft X-ray photons will be absorbed in the Si part, while hard X-ray photons will go through the Si part and will be detected in the CdTe part. The design of the sensor trays, peripheral circuits, power connections, and readout schemes are also described. The flight models of the HXI camera have been manufactured, tested and installed in the HXI instrument and then on the satellite.

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