The Si/CdTe semiconductor detector for hard X-ray imager (HXI) onboard ASTRO-H

Kouichi Hagino, Toshio Nakano, Goro Sato, Shin Ichiro Takeda, Hirokazu Odaka, Shin Watanabe, Kazuhiro Nakazawa, Motohide Kokubun, Tadayuki Takahashi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The hard X-ray imager (HXI) is the focal plane detector onboard ASTRO-H to be launched in 2014. By combining with the hard X-ray telescope, the HXI will realize the focusing imaging in the energy range from 5 up to 80 keV. The sensitivity of the HXI for an isolated point source will be two orders of magnitude better compared with previous missions. The hybrid structure composed of four layers of double-sided silicon strip detectors (DSSD) and one layer of cadmium telluride double-sided strip detector (CdTe-DSD) enables high detection efficiency in the hard X-ray band. The DSSD and CdTe-DSD for ASTRO-H have been developed, and their spectral and imaging performances were evaluated. By using two-strip events for the reconstructions of spectra and images, energy resolution of 1.0 keV at 13.9 keV and 2.0 keV at 59.5 keV, and sub-strip spatial resolution were achieved.

Original languageEnglish
Title of host publicationAIP Conference Proceedings
Pages809-812
Number of pages4
Volume1505
DOIs
Publication statusPublished - 2012
Event5th International Meeting on High Energy Gamma-Ray Astronomy - Heidelberg
Duration: 2012 Jul 92012 Jul 13

Other

Other5th International Meeting on High Energy Gamma-Ray Astronomy
CityHeidelberg
Period12/7/912/7/13

Fingerprint

strip
detectors
cadmium tellurides
x rays
hybrid structures
silicon
point sources
spatial resolution
telescopes
energy
sensitivity

Keywords

  • ASTRO-H mission
  • Double-sided strip detector
  • Hard X-ray Imager
  • Si/CdTe detector
  • X-ray/gamma-ray astrophysics

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Hagino, K., Nakano, T., Sato, G., Takeda, S. I., Odaka, H., Watanabe, S., ... Takahashi, T. (2012). The Si/CdTe semiconductor detector for hard X-ray imager (HXI) onboard ASTRO-H. In AIP Conference Proceedings (Vol. 1505, pp. 809-812) https://doi.org/10.1063/1.4772383

The Si/CdTe semiconductor detector for hard X-ray imager (HXI) onboard ASTRO-H. / Hagino, Kouichi; Nakano, Toshio; Sato, Goro; Takeda, Shin Ichiro; Odaka, Hirokazu; Watanabe, Shin; Nakazawa, Kazuhiro; Kokubun, Motohide; Takahashi, Tadayuki.

AIP Conference Proceedings. Vol. 1505 2012. p. 809-812.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hagino, K, Nakano, T, Sato, G, Takeda, SI, Odaka, H, Watanabe, S, Nakazawa, K, Kokubun, M & Takahashi, T 2012, The Si/CdTe semiconductor detector for hard X-ray imager (HXI) onboard ASTRO-H. in AIP Conference Proceedings. vol. 1505, pp. 809-812, 5th International Meeting on High Energy Gamma-Ray Astronomy, Heidelberg, 12/7/9. https://doi.org/10.1063/1.4772383
Hagino K, Nakano T, Sato G, Takeda SI, Odaka H, Watanabe S et al. The Si/CdTe semiconductor detector for hard X-ray imager (HXI) onboard ASTRO-H. In AIP Conference Proceedings. Vol. 1505. 2012. p. 809-812 https://doi.org/10.1063/1.4772383
Hagino, Kouichi ; Nakano, Toshio ; Sato, Goro ; Takeda, Shin Ichiro ; Odaka, Hirokazu ; Watanabe, Shin ; Nakazawa, Kazuhiro ; Kokubun, Motohide ; Takahashi, Tadayuki. / The Si/CdTe semiconductor detector for hard X-ray imager (HXI) onboard ASTRO-H. AIP Conference Proceedings. Vol. 1505 2012. pp. 809-812
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