Theoretical analysis of longevity testing on bubble memory devices

Yuu Watanabe, S. Hashimoto, Y. Watanabe, T. Kato, S. Ohteru

    Research output: Contribution to journalArticle

    Abstract

    This paper reports theoretical study results about magnetic bubble device long-term reliability testing. The bubble during propagation along permalloy tracks will be represented by a simple, one dimentional stochastic model. An equation to describe fluctuation in cylindrical bubble radius is approximated in the Langevin type stochastic differential equation, in which a set of small effects, such as interaction among bubbles and crystal nonuniformity, are considered as a white noise forcing term. Estimating the average time to bubble annihilation or run-out (bubble memory mean time to failure) is reduced to a level-crossing problem for a random process. Calculated bias field margin degradation shows good agreement with experimental results for an actual bubble device. Bubble material parameters for obtaining maximum operation time can be suggested. Furthermore, for problems where analytical solutions for the proposed model are difficult to get, Stochastic Hybrid Computer application is described with a practical example.

    Original languageEnglish
    Pages (from-to)1718
    Number of pages1
    JournalIEEE Transactions on Magnetics
    Volume15
    Issue number6
    DOIs
    Publication statusPublished - 1979

    Fingerprint

    Magnetic bubble devices
    Magnetic bubble memories
    Hybrid computers
    Computer applications
    White noise
    Stochastic models
    Random processes
    Differential equations
    Data storage equipment
    Degradation
    Crystals
    Testing

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

    Cite this

    Theoretical analysis of longevity testing on bubble memory devices. / Watanabe, Yuu; Hashimoto, S.; Watanabe, Y.; Kato, T.; Ohteru, S.

    In: IEEE Transactions on Magnetics, Vol. 15, No. 6, 1979, p. 1718.

    Research output: Contribution to journalArticle

    Watanabe, Y, Hashimoto, S, Watanabe, Y, Kato, T & Ohteru, S 1979, 'Theoretical analysis of longevity testing on bubble memory devices', IEEE Transactions on Magnetics, vol. 15, no. 6, pp. 1718. https://doi.org/10.1109/TMAG.1979.1060462
    Watanabe, Yuu ; Hashimoto, S. ; Watanabe, Y. ; Kato, T. ; Ohteru, S. / Theoretical analysis of longevity testing on bubble memory devices. In: IEEE Transactions on Magnetics. 1979 ; Vol. 15, No. 6. pp. 1718.
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