Theoretical Analysis of Longevity Testing on Bubble Memory Devices

Sadamu Ohteru; Tomokazu Kato; Yoshio Watanabe; Yuu Watanabe; Shuji Hashimoto

doi:10.1109/TMAG.1980.1060878

Theoretical Analysis of Longevity Testing on Bubble Memory Devices

Sadamu Ohteru, Tomokazu Kato, Yoshio Watanabe^*, Yuu Watanabe, Shuji Hashimoto

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

Theoretical results of magnetic bubble device long-term reliability testing are reported. The bubble during propagation along Permalloy tracks is represented by a simple, one-dimensional stochastic model. An equation to describe fluctuation in cylindrical bubble radius is approximated in the Langevin type stochastic differential equation, in which a set of small effects, such as interaction among bubbles and crystal nonuniformity, are considered as a white noise forcing term. Estimating the average time to bubble annihilation or runout (bubble memory mean time to failure) is reduced to a level-crossing problem for a random process. Calculated bias field margin degradation shows a qualitative agreement with experimental results for an actual bubble device. Bubble material parameters for obtaining maximum operation time are suggested.

Original language	English
Pages (from-to)	1399-1403
Number of pages	5
Journal	IEEE Transactions on Magnetics
Volume	MAG-16
Issue number	6
DOIs	https://doi.org/10.1109/TMAG.1980.1060878
Publication status	Published - 1980
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.1109/TMAG.1980.1060878

Cite this

@article{800f9727c707416d8e3597eb0d94655a,

title = "Theoretical Analysis of Longevity Testing on Bubble Memory Devices",

abstract = "Theoretical results of magnetic bubble device long-term reliability testing are reported. The bubble during propagation along Permalloy tracks is represented by a simple, one-dimensional stochastic model. An equation to describe fluctuation in cylindrical bubble radius is approximated in the Langevin type stochastic differential equation, in which a set of small effects, such as interaction among bubbles and crystal nonuniformity, are considered as a white noise forcing term. Estimating the average time to bubble annihilation or runout (bubble memory mean time to failure) is reduced to a level-crossing problem for a random process. Calculated bias field margin degradation shows a qualitative agreement with experimental results for an actual bubble device. Bubble material parameters for obtaining maximum operation time are suggested.",

author = "Sadamu Ohteru and Tomokazu Kato and Yoshio Watanabe and Yuu Watanabe and Shuji Hashimoto",

year = "1980",

doi = "10.1109/TMAG.1980.1060878",

language = "English",

volume = "MAG-16",

pages = "1399--1403",

journal = "IEEE Transactions on Magnetics",

issn = "0018-9464",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "6",

}

TY - JOUR

T1 - Theoretical Analysis of Longevity Testing on Bubble Memory Devices

AU - Ohteru, Sadamu

AU - Kato, Tomokazu

AU - Watanabe, Yoshio

AU - Watanabe, Yuu

AU - Hashimoto, Shuji

PY - 1980

Y1 - 1980

N2 - Theoretical results of magnetic bubble device long-term reliability testing are reported. The bubble during propagation along Permalloy tracks is represented by a simple, one-dimensional stochastic model. An equation to describe fluctuation in cylindrical bubble radius is approximated in the Langevin type stochastic differential equation, in which a set of small effects, such as interaction among bubbles and crystal nonuniformity, are considered as a white noise forcing term. Estimating the average time to bubble annihilation or runout (bubble memory mean time to failure) is reduced to a level-crossing problem for a random process. Calculated bias field margin degradation shows a qualitative agreement with experimental results for an actual bubble device. Bubble material parameters for obtaining maximum operation time are suggested.

AB - Theoretical results of magnetic bubble device long-term reliability testing are reported. The bubble during propagation along Permalloy tracks is represented by a simple, one-dimensional stochastic model. An equation to describe fluctuation in cylindrical bubble radius is approximated in the Langevin type stochastic differential equation, in which a set of small effects, such as interaction among bubbles and crystal nonuniformity, are considered as a white noise forcing term. Estimating the average time to bubble annihilation or runout (bubble memory mean time to failure) is reduced to a level-crossing problem for a random process. Calculated bias field margin degradation shows a qualitative agreement with experimental results for an actual bubble device. Bubble material parameters for obtaining maximum operation time are suggested.

UR - http://www.scopus.com/inward/record.url?scp=0019084037&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0019084037&partnerID=8YFLogxK

U2 - 10.1109/TMAG.1980.1060878

DO - 10.1109/TMAG.1980.1060878

M3 - Article

AN - SCOPUS:0019084037

SN - 0018-9464

VL - MAG-16

SP - 1399

EP - 1403

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

IS - 6

ER -

Theoretical Analysis of Longevity Testing on Bubble Memory Devices

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this