Theoretical derivation method of bit error rate in maximal ratio combining TDD transmitter diversity

Fumiaki Maehara, F. Sasamori, Fumio Takahata

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    The paper proposes a theoretical method to derive the BER performance in maximal ratio combining (MRC) time division duplex (TDD) transmitter diversity, with parameters of CNR, Doppler frequency, etc. The proposed theoretical approach can be applied not only to single-carrier transmission under flat fading, but also to orthogonal frequency division multiplexing (OFDM) under frequency selective fading. We choose OFDM transmission, in addition to single-carrier transmission, as a system model example to obtain numerical results, and the comparison between the theoretical results and simulated ones is demonstrated to confirm the validity of the proposed theoretical approach.

    Original languageEnglish
    Title of host publication2002 4th International Workshop on Mobile and Wireless Communications Network, MWCN 2002
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages61-65
    Number of pages5
    ISBN (Print)0780376056, 9780780376052
    DOIs
    Publication statusPublished - 2002
    Event4th International Workshop on Mobile and Wireless Communications Network, MWCN 2002 - Stockholm, Sweden
    Duration: 2002 Sep 92002 Sep 11

    Other

    Other4th International Workshop on Mobile and Wireless Communications Network, MWCN 2002
    CountrySweden
    CityStockholm
    Period02/9/902/9/11

    Keywords

    • bit error rate
    • maximal ratio combining (MRC)
    • OFDM
    • TDD
    • transmitter diversity

    ASJC Scopus subject areas

    • Computer Networks and Communications

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  • Cite this

    Maehara, F., Sasamori, F., & Takahata, F. (2002). Theoretical derivation method of bit error rate in maximal ratio combining TDD transmitter diversity. In 2002 4th International Workshop on Mobile and Wireless Communications Network, MWCN 2002 (pp. 61-65). [1045696] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWCN.2002.1045696