Theoretical derivation of bit error rate for uplink OFDMA over nonlinear fading channels

Kei Nishimura, Shoya Takebuchi, Fumiaki Maehara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper proposes the theoretical derivation method of both the frequency spectrum and the bit error rate (BER) performance for uplink Orthogonal Frequency Division Multiple Access (OFDMA) in the presence of the nonlinear distortion. Since OFDMA has two different subcarrier allocation methods such as localized FDMA (LFDMA) and interleaved FDMA (IFDMA), there is the difference, in terms of the influence of the nonlinear distortion at each mobile station (MS) on the out-band radiation and the BER degradation, between LFDMA and IFDMA. Therefore, it is meaningful to clarify this difference by means of the theoretical approach. The feature of the proposed approach is to represent both the frequency spectrum and the BER performance by the simple series form formula, which enables us to overview these performances without any time-consuming computer simulations. The validity of the proposed formula is confirmed by the agreement with the computer simulation results with the parameters of the number of MSs and the input back-off (IBO).

Original languageEnglish
Title of host publication2013 IEEE 24th Annual International Symposium on Personal, Indoor, and Mobile Radio Communications, PIMRC 2013
Pages761-765
Number of pages5
DOIs
Publication statusPublished - 2013 Dec 1
Event2013 IEEE 24th Annual International Symposium on Personal, Indoor, and Mobile Radio Communications, PIMRC 2013 - London, United Kingdom
Duration: 2013 Sep 82013 Sep 11

Publication series

NameIEEE International Symposium on Personal, Indoor and Mobile Radio Communications, PIMRC

Conference

Conference2013 IEEE 24th Annual International Symposium on Personal, Indoor, and Mobile Radio Communications, PIMRC 2013
CountryUnited Kingdom
CityLondon
Period13/9/813/9/11

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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