Sulfur is one of the most important elements found in air pollutants. A PIXE-induced XRF system equipped with a crystal spectrometer is a candidate to analyze chemical states of S in the pollutants. To aid in the design of the spectrometer for this purpose, fundamental data have been collected by calculating S Kβ spectra by use of the discrete variational Xα (DV-Xα) method for molecular orbital calculations. The calculated spectra have very faithfully reproduced XRF spectra observed for mixtures of Na2SO4, Na2SO3 and ZnS using a Ge (1 1 1) flat crystal spectrometer, which were used as representative chemical species including SO42- and SO32-, and as an example of sulfides in the air pollutants.
|Number of pages||5|
|Journal||Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms|
|Publication status||Published - 1999 Apr 2|
|Event||Proceedings of the 1998 8th International Conference on PIXE and its Analytical Applications - Lund, Swed|
Duration: 1998 Jun 14 → 1998 Jun 18
ASJC Scopus subject areas
- Nuclear and High Energy Physics