Thermal asperity of TMR heads for removable disk drives

Keishi Ohashi, Akinobu Sato, Kunihiko Ishihara, Takao Matsubara, Tsutomu Mitsuzuka, Hisanao Tsuge, Nobuyuki Ishiwata

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The thermal asperity of the tunneling magnetoresistive (TMR) head was studied using Zip-type flexible media, and compared with that of the anisotropic magnetoresistive (AMR) head. The examined head had a shielded structure with the TMR element close to the air bearing surface. Nevertheless, it generated relatively small thermal asperity even when the mechanical spacing between the head and medium was less than 20 nm, at which large and frequent thermal asperity was observed when the AMR head was used. Such relatively small thermal asperity of the TMR head is attributed mainly to the small low-temperature coefficient of the electric resistivity of the TMR element.

Original languageEnglish
Pages (from-to)1919-1921
Number of pages3
JournalIEEE Transactions on Magnetics
Volume37
Issue number4 I
DOIs
Publication statusPublished - 2001 Jul
Externally publishedYes

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Keywords

  • Flexible disk
  • Removable disk drive
  • Thermal asperity
  • Tunneling magnetoresistive head

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Physics and Astronomy (miscellaneous)

Cite this

Ohashi, K., Sato, A., Ishihara, K., Matsubara, T., Mitsuzuka, T., Tsuge, H., & Ishiwata, N. (2001). Thermal asperity of TMR heads for removable disk drives. IEEE Transactions on Magnetics, 37(4 I), 1919-1921. https://doi.org/10.1109/20.951008