Thermal asperity of TMR heads for removable disk drives

Keishi Ohashi, Akinobu Sato, Kunihiko Ishihara, Takao Matsubara, Tsutomu Mitsuzuka, Hisanao Tsuge, Nobuyuki Ishiwata

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The thermal asperity of the tunneling magnetoresistive (TMR) head was studied using Zip-type flexible media, and compared with that of the anisotropic magnetoresistive (AMR) head. The examined head had a shielded structure with the TMR element close to the air bearing surface. Nevertheless, it generated relatively small thermal asperity even when the mechanical spacing between the head and medium was less than 20 nm, at which large and frequent thermal asperity was observed when the AMR head was used. Such relatively small thermal asperity of the TMR head is attributed mainly to the small low-temperature coefficient of the electric resistivity of the TMR element.

Original languageEnglish
Pages (from-to)1919-1921
Number of pages3
JournalIEEE Transactions on Magnetics
Volume37
Issue number4 I
DOIs
Publication statusPublished - 2001 Jul
Externally publishedYes

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Bearings (structural)
gas bearings
Electric conductivity
spacing
electrical resistivity
Hot Temperature
coefficients
Air
Temperature

Keywords

  • Flexible disk
  • Removable disk drive
  • Thermal asperity
  • Tunneling magnetoresistive head

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Physics and Astronomy (miscellaneous)

Cite this

Ohashi, K., Sato, A., Ishihara, K., Matsubara, T., Mitsuzuka, T., Tsuge, H., & Ishiwata, N. (2001). Thermal asperity of TMR heads for removable disk drives. IEEE Transactions on Magnetics, 37(4 I), 1919-1921. https://doi.org/10.1109/20.951008

Thermal asperity of TMR heads for removable disk drives. / Ohashi, Keishi; Sato, Akinobu; Ishihara, Kunihiko; Matsubara, Takao; Mitsuzuka, Tsutomu; Tsuge, Hisanao; Ishiwata, Nobuyuki.

In: IEEE Transactions on Magnetics, Vol. 37, No. 4 I, 07.2001, p. 1919-1921.

Research output: Contribution to journalArticle

Ohashi, K, Sato, A, Ishihara, K, Matsubara, T, Mitsuzuka, T, Tsuge, H & Ishiwata, N 2001, 'Thermal asperity of TMR heads for removable disk drives', IEEE Transactions on Magnetics, vol. 37, no. 4 I, pp. 1919-1921. https://doi.org/10.1109/20.951008
Ohashi K, Sato A, Ishihara K, Matsubara T, Mitsuzuka T, Tsuge H et al. Thermal asperity of TMR heads for removable disk drives. IEEE Transactions on Magnetics. 2001 Jul;37(4 I):1919-1921. https://doi.org/10.1109/20.951008
Ohashi, Keishi ; Sato, Akinobu ; Ishihara, Kunihiko ; Matsubara, Takao ; Mitsuzuka, Tsutomu ; Tsuge, Hisanao ; Ishiwata, Nobuyuki. / Thermal asperity of TMR heads for removable disk drives. In: IEEE Transactions on Magnetics. 2001 ; Vol. 37, No. 4 I. pp. 1919-1921.
@article{75f470d867d147a2a9f39c3ce5446b25,
title = "Thermal asperity of TMR heads for removable disk drives",
abstract = "The thermal asperity of the tunneling magnetoresistive (TMR) head was studied using Zip-type flexible media, and compared with that of the anisotropic magnetoresistive (AMR) head. The examined head had a shielded structure with the TMR element close to the air bearing surface. Nevertheless, it generated relatively small thermal asperity even when the mechanical spacing between the head and medium was less than 20 nm, at which large and frequent thermal asperity was observed when the AMR head was used. Such relatively small thermal asperity of the TMR head is attributed mainly to the small low-temperature coefficient of the electric resistivity of the TMR element.",
keywords = "Flexible disk, Removable disk drive, Thermal asperity, Tunneling magnetoresistive head",
author = "Keishi Ohashi and Akinobu Sato and Kunihiko Ishihara and Takao Matsubara and Tsutomu Mitsuzuka and Hisanao Tsuge and Nobuyuki Ishiwata",
year = "2001",
month = "7",
doi = "10.1109/20.951008",
language = "English",
volume = "37",
pages = "1919--1921",
journal = "IEEE Transactions on Magnetics",
issn = "0018-9464",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "4 I",

}

TY - JOUR

T1 - Thermal asperity of TMR heads for removable disk drives

AU - Ohashi, Keishi

AU - Sato, Akinobu

AU - Ishihara, Kunihiko

AU - Matsubara, Takao

AU - Mitsuzuka, Tsutomu

AU - Tsuge, Hisanao

AU - Ishiwata, Nobuyuki

PY - 2001/7

Y1 - 2001/7

N2 - The thermal asperity of the tunneling magnetoresistive (TMR) head was studied using Zip-type flexible media, and compared with that of the anisotropic magnetoresistive (AMR) head. The examined head had a shielded structure with the TMR element close to the air bearing surface. Nevertheless, it generated relatively small thermal asperity even when the mechanical spacing between the head and medium was less than 20 nm, at which large and frequent thermal asperity was observed when the AMR head was used. Such relatively small thermal asperity of the TMR head is attributed mainly to the small low-temperature coefficient of the electric resistivity of the TMR element.

AB - The thermal asperity of the tunneling magnetoresistive (TMR) head was studied using Zip-type flexible media, and compared with that of the anisotropic magnetoresistive (AMR) head. The examined head had a shielded structure with the TMR element close to the air bearing surface. Nevertheless, it generated relatively small thermal asperity even when the mechanical spacing between the head and medium was less than 20 nm, at which large and frequent thermal asperity was observed when the AMR head was used. Such relatively small thermal asperity of the TMR head is attributed mainly to the small low-temperature coefficient of the electric resistivity of the TMR element.

KW - Flexible disk

KW - Removable disk drive

KW - Thermal asperity

KW - Tunneling magnetoresistive head

UR - http://www.scopus.com/inward/record.url?scp=0035386623&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035386623&partnerID=8YFLogxK

U2 - 10.1109/20.951008

DO - 10.1109/20.951008

M3 - Article

AN - SCOPUS:0035386623

VL - 37

SP - 1919

EP - 1921

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

SN - 0018-9464

IS - 4 I

ER -