Thermal conductivity of SrVO3-SrTiO3 thin films

Evidence of intrinsic thermal resistance at the interface between oxide layers

Takuro Katsufuji, Takuo Saiki, S. Okubo, Y. Katayama, K. Ueno

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

By using a technique of thermoreflectance that can precisely measure the thermal conductivity of thin films, we found that the thermal conductivity of SrVO3-SrTiO3 multilayer thin films normal to the surface was substantially reduced by decreasing the thickness of each layer. This indicates that a large intrinsic thermal resistance exists at the interface between SrVO3 and SrTiO3 in spite of the similar phononic properties for these two compounds.

Original languageEnglish
Article number051002
JournalPhysical Review Materials
Volume2
Issue number5
DOIs
Publication statusPublished - 2018 May 8

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thermal resistance
Heat resistance
Oxides
Thermal conductivity
thermal conductivity
Thin films
oxides
Multilayer films
thin films
strontium titanium oxide

ASJC Scopus subject areas

  • Materials Science(all)
  • Physics and Astronomy (miscellaneous)

Cite this

Thermal conductivity of SrVO3-SrTiO3 thin films : Evidence of intrinsic thermal resistance at the interface between oxide layers. / Katsufuji, Takuro; Saiki, Takuo; Okubo, S.; Katayama, Y.; Ueno, K.

In: Physical Review Materials, Vol. 2, No. 5, 051002, 08.05.2018.

Research output: Contribution to journalArticle

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