Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) using the metal-cluster-complex primary ion of Ir₄(CO)₇⁺

Engineering & Materials Science

• Secondary ion mass spectrometry 100%
• Ionic liquids 92%
• Ions 61%
• Positive ions 49%
• Metals 42%
• Ion sources 40%
• Ion beams 37%
• Molecular weight 30%
• Molecules 26%
• Mass spectrometers 18%
• Negative ions 18%
• Molten materials 13%
• Salts 12%
• Silicon 10%
• Substrates 9%
• Temperature 5%

Physics & Astronomy

• metal clusters 80%
• secondary ion mass spectrometry 68%
• liquids 35%
• cations 33%
• ions 31%
• mass spectrometers 27%
• ion sources 26%
• molecular weight 25%
• ion beams 20%
• imides 18%
• molten salts 16%
• molecules 14%
• anions 12%
• bombardment 12%
• fragmentation 12%
• room temperature 7%
• silicon 7%

Chemical Compounds

• Time-of-Flight Secondary Ion Mass Spectrometry 80%
• Ionic Liquid 50%
• Secondary Ion 33%
• Ion Beam 29%
• Ion 26%
• Polyatomic Cation 24%
• Polyatomic Anion 22%
• Weight 14%
• Molten Salt 14%
• Imide 12%
• Fragmentation 11%
• Ammonium 10%
• Molecule 9%
• Cation 7%
• Ambient Reaction Temperature 7%
• Energy 6%