Timing monitoring paths selection for wide voltage IC

Weiwei Shan, Wentao Dai, Youhua Shi, Peng Cao, Xiaoyan Xiang

    Research output: Contribution to journalArticle

    5 Citations (Scopus)

    Abstract

    Wide voltage range circuit has got widespread attention where in-situ timing monitoring based adaptive voltage scaling (AVS) becomes necessary to reduce the design margin. However, the severe PVT variations across near-threshold to super-threshold cause too many critical paths to be monitored. Here activation oriented monitoring paths selection method is proposed to reduce the monitored paths for wide voltage IC. The minimum delay value of the longest activated path is found by dynamic timing analysis and set as the selection threshold. Those paths longer than this threshold by STA analysis are selected to be monitored. Applied on a 40 nm AVS Systemon-Chip, it reduces the monitoring paths to only 22% of all critical paths with remarkable power gains under 0.6 V–1.1 V.

    Original languageEnglish
    JournalIEICE Electronics Express
    Volume13
    Issue number8
    DOIs
    Publication statusPublished - 2016 Mar 29

    Fingerprint

    time measurement
    Monitoring
    Electric potential
    electric potential
    thresholds
    Chemical activation
    Networks (circuits)
    scaling
    power gain
    margins
    chips
    activation
    Voltage scaling
    causes

    Keywords

    • Low power
    • Path selection
    • Timing monitor
    • Wide voltage range

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Electrical and Electronic Engineering

    Cite this

    Timing monitoring paths selection for wide voltage IC. / Shan, Weiwei; Dai, Wentao; Shi, Youhua; Cao, Peng; Xiang, Xiaoyan.

    In: IEICE Electronics Express, Vol. 13, No. 8, 29.03.2016.

    Research output: Contribution to journalArticle

    Shan, Weiwei ; Dai, Wentao ; Shi, Youhua ; Cao, Peng ; Xiang, Xiaoyan. / Timing monitoring paths selection for wide voltage IC. In: IEICE Electronics Express. 2016 ; Vol. 13, No. 8.
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