Topology-Optimization-Based EMC Design

Katsuya Nomura, Atsuhiro Takahashi, Takashi Kojima, Shintaro Yamasaki, Kentaro Yaji, Hiroki Bo, Kikuo Fujita

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In electromagnetic compatibility (EMC) design, it is important to mitigate the dominant effect among those caused by many unintentional parasitic elements or couplings. However, the dominant effect is usually unclear and hence EMC engineers often resort to trial and error to find an effective counterplan. This paper presents an approach for aiding engineers in finding a better design plan using topology optimization, which is a simulation-based structural optimization method. The proposed approach is applied to the conductor pattern design in simple circuits of electromagnetic interference filters, in which the dominant effect is conduction or induction noise depending on the circuit parameters. It is demonstrated that a structure with a reduced dominant effect is obtained automatically, and the utilization of the optimized result for EMC design is also discussed.

Original languageEnglish
Title of host publicationEMC Europe 2019 - 2019 International Symposium on Electromagnetic Compatibility
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages933-937
Number of pages5
ISBN (Electronic)9781728105932
DOIs
Publication statusPublished - 2019 Sep
Externally publishedYes
Event2019 International Symposium on Electromagnetic Compatibility, EMC Europe 2019 - Barcelona, Spain
Duration: 2019 Sep 22019 Sep 6

Publication series

NameEMC Europe 2019 - 2019 International Symposium on Electromagnetic Compatibility

Conference

Conference2019 International Symposium on Electromagnetic Compatibility, EMC Europe 2019
Country/TerritorySpain
CityBarcelona
Period19/9/219/9/6

Keywords

  • conductor pattern
  • dominant effect
  • EMC design
  • Topology optimization

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Instrumentation
  • Radiation

Fingerprint

Dive into the research topics of 'Topology-Optimization-Based EMC Design'. Together they form a unique fingerprint.

Cite this