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Total Dose Dependence of Soft-Error Hardness in 64kbit SRAMs Evaluated by Single-Ion Microprobe Technique
T. Matsukawa, A. Kishida, T. Tanii, M. Koh, K. Horita, K. Hara, B. Shigeta, M. Goto, I. Ohdomari, S. Matsuda, S. Kuboyama
Research output: Contribution to journal › Article › peer-review
25
Citations
(Scopus)