Total Dose Dependence of Soft-Error Hardness in 64kbit SRAMs Evaluated by Single-Ion Microprobe Technique

T. Matsukawa, A. Kishida, T. Tanii, M. Koh, K. Horita, K. Hara, B. Shigeta, M. Goto, I. Ohdomari, S. Matsuda, S. Kuboyama

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