Transmission electron microscopy of Co2(Cr1-xFex)Al sputtered films and their magnetic tunneling junctions

Y. K. Takahashi, T. Ohkubo, K. Hono, S. Okamura, N. Tezuka, K. Inomata

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

The microstructures of Co2FeAl and Co2(Cr0.4Fe0.6)Al sputtered films and of their magnetic tunnel junctions (MTJs) have been investigated to discuss the possible reasons for an unexpectedly low tunneling magnetoresistance (TMR). The structure of the Co2FeAl film changed from B2 to L21 with increasing substrate temperature, while that of the Co2(Cr0.4Fe0.6)Al film remained B2 up to 500 °C. The thermodynamically predicted phase separation was not observed in the films. The low TMR values obtained from the MTJs using the Co2FeAl and Co2(Cr0.4Fe0.6)Al films are attributed to the low-spin polarization expected from the low degree of order in these films. The TMR values depend sensitively on the interfacial structure of the tunnel junctions when the degree of order of the film is low.

Original languageEnglish
Pages (from-to)378-382
Number of pages5
JournalJournal of Magnetism and Magnetic Materials
Volume313
Issue number2
DOIs
Publication statusPublished - 2007 Jun
Externally publishedYes

Keywords

  • Co(CrFe)Al film
  • Magnetic tunnel junctions
  • Microstructure

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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