Two beam collection mode photon scanning tunneling microscope

Tetsuya Kawanishi, Kouichiro Tamada, Masao Kitano

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

We studied the image deformation due to the surface inclination of objects in photon scanning tunneling microscopes (PSTM). A novel collection mode PSTM with two light sources is proposed to reduce the deformation and experimental results show that the PSTM system is effective.

Original languageEnglish
Pages (from-to)601-604
Number of pages4
JournalOptical Review
Volume4
Issue number5
Publication statusPublished - 1997 Sep
Externally publishedYes

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microscopes
scanning
photons
inclination
light sources

Keywords

  • Deformation of image
  • Evanescent wave
  • Inclination of surface
  • Near field
  • Photon scanning tunneling microscope

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Two beam collection mode photon scanning tunneling microscope. / Kawanishi, Tetsuya; Tamada, Kouichiro; Kitano, Masao.

In: Optical Review, Vol. 4, No. 5, 09.1997, p. 601-604.

Research output: Contribution to journalArticle

Kawanishi, T, Tamada, K & Kitano, M 1997, 'Two beam collection mode photon scanning tunneling microscope', Optical Review, vol. 4, no. 5, pp. 601-604.
Kawanishi, Tetsuya ; Tamada, Kouichiro ; Kitano, Masao. / Two beam collection mode photon scanning tunneling microscope. In: Optical Review. 1997 ; Vol. 4, No. 5. pp. 601-604.
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